Fourier transform infrared ellipsometry of thin polymer films

1986 ◽  
Vol 58 (1) ◽  
pp. 64-68 ◽  
Author(s):  
Robert T. Graf ◽  
Jack L. Koenig ◽  
Hatsuo. Ishida
Keyword(s):  
Fourier Transform ◽  
Polymer Films ◽  
Fourier Transform Infrared ◽  
Thin Polymer Films ◽  
Infrared Ellipsometry ◽  
Thin Polymer

Applications of Fourier transform Raman spectroscopy to studies of thin polymer films

1990 ◽  
Vol 94 (2) ◽  
pp. 939-943 ◽  
Author(s):  
C. G. Zimba ◽  
S. Turrell ◽  
J. D. Swalen ◽  
V. M. Hallmark ◽  
J. F. Rabolt
Keyword(s):  
Raman Spectroscopy ◽  
Fourier Transform ◽  
Polymer Films ◽  
Thin Polymer Films ◽  
Thin Polymer ◽  
Fourier Transform Raman Spectroscopy ◽  
Fourier Transform Raman

Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation

1998 ◽  
Vol 5 (5) ◽  
pp. 1304-1308 ◽  
Author(s):  
Keitaro Kago ◽  
Hitoshi Endo ◽  
Hideki Matsuoka ◽  
Hitoshi Yamaoka ◽  
Nozomu Hamaya ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Synchrotron Radiation ◽  
Film Thickness ◽  
Polymer Films ◽  
Curve Fitting ◽  
Thin Polymer Films ◽  
X Ray ◽  
Fitting Procedure ◽  
Thin Polymer

X-ray reflectivity (XR) measurements with a synchrotron radiation source were carried out for thin polymer films on a glass plate. From the XR data, the film thickness and surface and interface roughnesses could be determined. In addition, the appropriate conditions and precision for measurements were also discussed. Kiessig fringes were observed clearly for specular XR measurements of poly(methylmethacrylate) thin film. Analysis of the XR data allowed the determination of the film thickness very precisely. By a curve-fitting procedure of the XR profile, the film-surface roughness and film–substrate interface roughnesses were determined. A Fourier transform of the XR data was performed as an alternative method of evaluating the film thickness. The values for the film thickness obtained by the curve-fitting procedure and Fourier-transform procedure were slightly different from each other. One possibility for the cause of this difference may be an integral error and/or cut-off effect in the Fourier-transform procedure. The XR technique with synchrotron radiation is a very powerful tool for structural characterization of thin polymer films.

Is the chain dynamics in thin polymer films isotropic ?

2000 ◽  
Vol 10 (PR7) ◽  
pp. Pr7-233-Pr7-237 ◽  
Author(s):  
S. Rivillon ◽  
P. Auroy ◽  
B. Deloche
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
Chain Dynamics ◽  
Thin Polymer

Reducing the сontact angle hysteresis of thin polymer films by oil impregnation in supercritical carbon dioxide

2021 ◽  
Vol 154 ◽  
pp. 106202
Author(s):  
Polina S. Kazaryan ◽  
Maria A. Agalakova ◽  
Elena P. Kharitonova ◽  
Marat O. Gallyamov ◽  
Mikhail S. Kondratenko
Keyword(s):  
Carbon Dioxide ◽  
Supercritical Carbon Dioxide ◽  
Polymer Films ◽  
Thin Polymer Films ◽  
Thin Polymer ◽  
Oil Impregnation ◽  
Supercritical Carbon

Spectroelectrochemical Identification of the Active Sites for Protons and Anions Insertions into Poly-(Azure A) Thin Polymer Films

2007 ◽  
Vol 111 (38) ◽  
pp. 14230-14237 ◽  
Author(s):  
J. Agrisuelas ◽  
C. Gabrielli ◽  
J. J. García-Jareño ◽  
D. Giménez-Romero ◽  
H. Perrot ◽  
...  
Keyword(s):  
Polymer Films ◽  
Active Sites ◽  
Thin Polymer Films ◽  
Azure A ◽  
Thin Polymer

scholarly journals Transmittances of thin polymer films and their suitability as a supportive substrate for a soft x-ray solar filter

1991 ◽  
Author(s):  
Memorie K. Williams ◽  
Evan Hansen ◽  
Arturo Reyes-Mena ◽  
David D. Allred
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
X Ray ◽  
Thin Polymer
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