scholarly journals An investigation progress toward Be-based ablator materials for the inertial confinement fusion

Author(s):  
Bingchi Luo ◽  
Jiqiang Zhang ◽  
Yudan He ◽  
Long Chen ◽  
Jiangshan Luo ◽  
...  

The Be-based materials with many particular properties lead to an important research subject. The investigation progresses in the fabrication technologies are introduced here, including main three kinds of Be-based materials, such as Be–Cu capsule, $\text{Be}_{2}\text{C}$ ablator and high-purity Be material. Compared with the pioneer workgroup on Be-based materials, the differences in Be–Cu target fabrication were described, and a grain refinement technique by an active hydrogen reaction for Be coating was proposed uniquely. $\text{Be}_{2}\text{C}$ coatings were first prepared by the DC reactive magnetron sputtering with a high deposition rate $({\sim}300~\text{nm}/\text{h})$. Pure polycrystalline $\text{Be}_{2}\text{C}$ films with uniform microstructures, smooth surface, high density $({\sim}2.2~\text{g}\cdot \text{cm}^{3})$ and good optical transparency were fabricated. In addition, the high-purity Be materials with metal impurities in a ppm magnitude were fabricated by the pyrolysis of organometallic Be.

Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2020 ◽  
Vol 36 ◽  
pp. 100749 ◽  
Author(s):  
R.E. Olson ◽  
R.J. Leeper ◽  
S.H. Batha ◽  
R.R. Peterson ◽  
P.A. Bradley ◽  
...  

2021 ◽  
Vol 28 (3) ◽  
pp. 032713
Author(s):  
Dongguo Kang ◽  
Huasen Zhang ◽  
Shiyang Zou ◽  
Wudi Zheng ◽  
Shaoping Zhu ◽  
...  

2021 ◽  
Vol 92 (7) ◽  
pp. 073505
Author(s):  
T. J. Awe ◽  
L. Perea ◽  
J. C. Hanson ◽  
A. J. York ◽  
D. W. Johnson ◽  
...  

2021 ◽  
Vol 141 ◽  
pp. 107158
Author(s):  
Jiamei Li ◽  
Dawei Li ◽  
Hui Yu ◽  
Fengnian Lv ◽  
Qiong Zhou ◽  
...  

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