Depth-profiled characterization of complex refractive index of ion implanted optically transparent polymers using multilayer calculations and reflectance data

Vacuum ◽  
2012 ◽  
Vol 86 (12) ◽  
pp. 1822-1827 ◽  
Author(s):  
Hristiyan Y. Stoyanov ◽  
Ivan L. Stefanov ◽  
Gichka G. Tsutsumanova ◽  
Stoyan C. Russev ◽  
Georgi B. Hadjichristov
Keyword(s):  
Refractive Index ◽  
Complex Refractive Index ◽  
Optically Transparent ◽  
Transparent Polymers ◽  
Reflectance Data ◽  
Ion Implanted

Optical Technique for Characterization of High Energy Ion Implanted Materials

1992 ◽  
Vol 268 ◽  
Author(s):  
Gustavo E Aizenberg ◽  
Pieter L Swart ◽  
Beatrys M Lacquet
Keyword(s):  
Refractive Index ◽  
Digital Signal ◽  
Amorphous Layer ◽  
High Energy ◽  
Optical Technique ◽  
Concentration Peak ◽  
Non Destructive ◽  
Reflectance Data ◽  
Ion Implanted

ABSTRACTA new method for the characterization of high energy ion-implanted materials has been developed. The refractive index and thickness of the amorphous layer produced by ion-implantation as well as the recrystallized layer formed by annealing of the ionimplanted samples can be determined by means of this non-destructive optical technique.For frequencies where the carriers do not respond, the measured reflectance is bilinear transformed, and further digital signal processing yields information about thickness and refractive index of the abovementioned layers. When working at optical frequencies where the carriers can respond to the electromagnetic field the physical position of the peak concentration follows directly from the processed reflectance data. Simulated and experimental data have been analyzed. The position of the boundaries between the amorphous, recrystallized and substrate zones, as well as the position of the carrier concentration peak can be determined for various steps of annealing. The algorithm has the advantage of being simple and time efficient.

Ellipsometrical characterization of complex refractive index depth profile of 50 keV silicon ion implanted PMMA

Vacuum ◽  
2013 ◽  
Vol 94 ◽  
pp. 19-25 ◽  
Author(s):  
Stoyan C. Russev ◽  
Gichka G. Tsutsumanova ◽  
Ivan L. Stefanov ◽  
Georgi B. Hadjichristov
Keyword(s):  
Refractive Index ◽  
Depth Profile ◽  
Complex Refractive Index ◽  
Ion Implanted

INVESTIGATIONS ON AZO/Al/AZO MULTILAYER STRUCTURE GROWN AT ROOM TEMPERATURE

2018 ◽  
Vol 25 (08) ◽  
pp. 1950033
Author(s):  
SAAD AMARA ◽  
MOHAMED BOUAFIA
Keyword(s):  
Refractive Index ◽  
Room Temperature ◽  
Incidence Angle ◽  
Metal Layer ◽  
Complex Refractive Index ◽  
Visible Range ◽  
Light Emitting ◽  
The Real ◽  
Pl Emission

In this work we investigate the effect of metal layer in the Al-doped ZnO (AZO)/Al/AZO structure. AZO and Al thin films are deposed successively at room temperature using DC magnetron sputtering by rotating the substrate holder without breaking the vacuum. The optical characterization of AZO/Al/AZO structure was performed by the spectroscopic ellipsometry under different incidence angles (55[Formula: see text], 65[Formula: see text] and 75[Formula: see text]). For the AZO monolayer structure, it was found that the complex refractive index and the complex permittivity coefficient varied differently according to the incidence angle. The addition of Al layer (5[Formula: see text]nm thicknesses) in this monostructure reduces significantly this influence on the measurement, homogenizes the real refractive index variation and significantly reduces the real electrical coefficient permittivity in the visible range. In addition, the obtained depolarization values confirm the results of the AFM roughness revealing that the Al layer addition makes the surface smoother so that it meets the required conditions as the bottom electrode of organic light emitting diodes. The photoluminescence (PL) measurements indicate that the Al layer alters the PL emission. Actually, the Al layer enhances subsequently the PL emission and promotes the blue and red emission.

scholarly journals Characterization of broadband complex refractive index of synthetic melanin coatings and their changes after ultraviolet irradiation

2020 ◽  
Vol 117 (20) ◽  
pp. 203701
Author(s):  
Weiyao Li ◽  
Anvay Patil ◽  
Xuhao Zhou ◽  
Zhao Wang ◽  
Ming Xiao ◽  
...  
Keyword(s):  
Refractive Index ◽  
Ultraviolet Irradiation ◽  
Complex Refractive Index

Laser characterization of the depth profile of complex refractive index of PMMA implanted with 50 keV silicon ions

2013 ◽  
Author(s):  
Ivan L. Stefanov ◽  
Hristiyan Y. Stoyanov ◽  
Elitza Petrova ◽  
Stoyan C. Russev ◽  
Gichka G. Tsutsumanova ◽  
...  
Keyword(s):  
Refractive Index ◽  
Depth Profile ◽  
Complex Refractive Index ◽  
Silicon Ions
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