Spinodal decomposition of Ti0.33Al0.67N thin films studied by atom probe tomography

2012 ◽  
Vol 520 (13) ◽  
pp. 4362-4368 ◽  
Author(s):  
L.J.S. Johnson ◽  
M. Thuvander ◽  
K. Stiller ◽  
M. Odén ◽  
L. Hultman
Keyword(s):  
Thin Films ◽  
Spinodal Decomposition ◽  
Atom Probe Tomography ◽  
Atom Probe

Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

2019 ◽  
Vol 236 ◽  
pp. 92-95 ◽  
Author(s):  
Hisham Aboulfadl ◽  
Fabian Seifried ◽  
Michael Stüber ◽  
Frank Mücklich
Keyword(s):  
Thin Films ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Multilayer Thin Films

Atom probe tomography study of GaMnN thin films

2012 ◽  
Vol 9 (3-4) ◽  
pp. 723-726
Author(s):  
Robert Nicholas ◽  
David Diercks ◽  
Matthew Kane
Keyword(s):  
Thin Films ◽  
Atom Probe Tomography ◽  
Atom Probe

Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography

2018 ◽  
Vol 153 ◽  
pp. 109-113
Author(s):  
Georges Beainy ◽  
Reynald Alcotte ◽  
Franck Bassani ◽  
Mickaël Martin ◽  
Adeline Grenier ◽  
...  
Keyword(s):  
Thin Films ◽  
Spatial Distribution ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Direct Examination

scholarly journals Application of Atom Probe Tomography to Atomic Layer Deposited Thin Films

2013 ◽  
Vol 19 (S2) ◽  
pp. 1028-1029
Author(s):  
A.D. Giddings ◽  
T.J. Prosa ◽  
T.F. Kelly ◽  
D.J. Larson
Keyword(s):  
Thin Films ◽  
Atom Probe Tomography ◽  
Atomic Layer ◽  
Atom Probe

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

scholarly journals Evidence of Superparamagnetic Co Clusters in Pulsed Laser Deposition-Grown Zn0.9Co0.1O Thin Films Using Atom Probe Tomography

2011 ◽  
Vol 133 (5) ◽  
pp. 1451-1458 ◽  
Author(s):  
Rodrigue Lardé ◽  
Etienne Talbot ◽  
Philippe Pareige ◽  
Herrade Bieber ◽  
Guy Schmerber ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Atom Probe Tomography ◽  
Pulsed Laser ◽  
Atom Probe ◽  
Laser Deposition

scholarly journals Correlating Interfacial Structure and Magnetism in Fe-MgO Thin Films Using Electron Microscopy, Neutron Reflectometry, and Atom Probe Tomography

2010 ◽  
Vol 16 (S2) ◽  
pp. 1526-1527
Author(s):  
SR Spurgeon ◽  
CR Winkler ◽  
BJ Kirby ◽  
CL Johnson ◽  
DN Seidman ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Neutron Reflectometry ◽  
Interfacial Structure

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

scholarly journals Effect of Stress on Spinodal Decomposition in Binary Alloys: Atomistic Modeling and Atom Probe Tomography

2021 ◽  
Author(s):  
Alexander Dahlström ◽  
Frederic Danoix ◽  
Peter Hedström ◽  
Joakim Odqvist ◽  
Helena Zapolsky
Keyword(s):  
Tensile Stress ◽  
Spinodal Decomposition ◽  
Atom Probe Tomography ◽  
Critical Phenomenon ◽  
Binary Alloys ◽  
Alloy System ◽  
Atom Probe ◽  
Stress Effect ◽  
Atomistic Modeling ◽  
Characteristic Wavelength

AbstractSelf-organizing nanostructure evolution through spinodal decomposition is a critical phenomenon determining the properties of many materials. Here, we study the influence of stress on the morphology of the nanostructure in binary alloys using atomistic modeling and atom probe tomography. The atomistic modeling is based on the quasi-particle approach, and it is compared to quantitative three-dimensional (3-D) atom mapping results. It is found that the magnitude of the stress and the crystallographic direction of the applied stress directly affect the development of spinodal decomposition and the nanostructure morphology. The modulated nanostructure of the binary bcc alloy system is quantified by a characteristic wavelength, $$ \lambda $$ λ . From modeling the tensile stress effect on the A-35 at. pct B system, we find that $$ \lambda _{001}< \, \lambda _{111}< \, \lambda _{101}< \, \lambda _{112}$$ λ 001 < λ 111 < λ 101 < λ 112 and the same trend are observed in the experimental measurements on an Fe-35 at. pct Cr alloy. Furthermore, the effect of applied compressive and shear stress states differs from the effect of the applied tensile stress regarding morphological anisotropy.

scholarly journals Depth Analysis of Ta/NiFe/Ta/CoFeB/Ta/NiFe Multilayer Thin Films: Comparison of Atom Probe Tomography and Auger Electron Spectroscopy

2014 ◽  
Vol 20 (3) ◽  
pp. 207-210
Author(s):  
Masaki Kubota ◽  
Yoichi Ishida ◽  
Katsuaki Yanagiuchi ◽  
Hisashi Takamizawa ◽  
Yasuko Nozawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Auger Electron Spectroscopy ◽  
Atom Probe Tomography ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Atom Probe ◽  
Multilayer Thin Films ◽  
Depth Analysis
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