scholarly journals Depth Analysis of Ta/NiFe/Ta/CoFeB/Ta/NiFe Multilayer Thin Films: Comparison of Atom Probe Tomography and Auger Electron Spectroscopy

2014 ◽  
Vol 20 (3) ◽  
pp. 207-210
Author(s):  
Masaki Kubota ◽  
Yoichi Ishida ◽  
Katsuaki Yanagiuchi ◽  
Hisashi Takamizawa ◽  
Yasuko Nozawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Auger Electron Spectroscopy ◽  
Atom Probe Tomography ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Atom Probe ◽  
Multilayer Thin Films ◽  
Depth Analysis

Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

2019 ◽  
Vol 236 ◽  
pp. 92-95 ◽  
Author(s):  
Hisham Aboulfadl ◽  
Fabian Seifried ◽  
Michael Stüber ◽  
Frank Mücklich
Keyword(s):  
Thin Films ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Multilayer Thin Films
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