Silicon nanowire growth on glass substrates using hot wire chemical vapor deposition

2011 ◽  
Vol 519 (14) ◽  
pp. 4609-4612 ◽  
Author(s):  
Nagsen P. Meshram ◽  
Alka Kumbhar ◽  
R.O. Dusane
2009 ◽  
Vol 517 (12) ◽  
pp. 3588-3590 ◽  
Author(s):  
A. Bink ◽  
M. Brinza ◽  
J.P.H. Jongen ◽  
R.E.I. Schropp

2007 ◽  
Vol 989 ◽  
Author(s):  
Charles W. Teplin ◽  
Howard M. Branz ◽  
Kim M. Jones ◽  
Manuel J. Romero ◽  
Paul Stradins ◽  
...  

AbstractDuring the last few years, hot-wire chemical vapor deposition (HWCVD) has been explored as a low-temperature process for epitaxially thickening c-Si seeds layers on low cost substrates. Here, we demonstrate HWCVD epitaxy on thin polycrystalline silicon seed layers on borosilicate glass substrates. The crystal Si seeds are large-grained (~10 µm) polycrystalline silicon that were fabricated by Al-induced crystallization of a-Si. We report the growth of 0.5 µm of epitaxy at ~670°C.


2018 ◽  
Vol 10 (3) ◽  
pp. 03001-1-03001-6 ◽  
Author(s):  
Bharat Gabhale ◽  
◽  
Ashok Jadhawar ◽  
Ajinkya Bhorde ◽  
Shruthi Nair ◽  
...  

Crystals ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 237
Author(s):  
M. Abul Hossion ◽  
B. M. Arora

Boron-doped polycrystalline silicon film was synthesized using hot wire chemical vapor deposition technique for possible application in photonics devices. To investigate the effect of substrate, we considered Si/SiO2, glass/ITO/TiO2, Al2O3, and nickel tungsten alloy strip for the growth of polycrystalline silicon films. Scanning electron microscopy, optical reflectance, optical transmittance, X-ray diffraction, and I-V measurements were used to characterize the silicon films. The resistivity of the film was 1.3 × 10−2 Ω-cm for the polycrystalline silicon film, which was suitable for using as a window layer in a solar cell. These films have potential uses in making photodiode and photosensing devices.


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