scholarly journals Raman measurements and stress analysis in gallium ion-implanted gallium nitride epitaxial layers on sapphire

2006 ◽  
Vol 515 (4) ◽  
pp. 2798-2802
Author(s):  
S. Mal ◽  
A. Singha ◽  
S. Dhara ◽  
A. Roy
2016 ◽  
Vol 61 (3) ◽  
pp. 428-431
Author(s):  
A. A. Yugov ◽  
A. A. Donskov ◽  
T. G. Yugova ◽  
I. A. Belogorohov ◽  
Yu. N. Parhomenko

1999 ◽  
Vol 28 (3) ◽  
pp. 319-324 ◽  
Author(s):  
R. D. Dupuis ◽  
C. J. Eiting ◽  
P. A. Grudowski ◽  
H. Hsia ◽  
Z. Tang ◽  
...  

1971 ◽  
Vol 9 ◽  
pp. 158-164 ◽  
Author(s):  
D.K. Wickenden ◽  
K.R. Faulkner ◽  
R.W. Brander ◽  
B.J. Isherwood

Author(s):  
Bernard Beaumont ◽  
Pierre Gibart ◽  
Nicolas Grandjean ◽  
Jean Massies

2016 ◽  
Vol 185 ◽  
pp. 315-318 ◽  
Author(s):  
Lin Qi ◽  
Yu Xu ◽  
Zongyao Li ◽  
En Zhao ◽  
Song Yang ◽  
...  

2011 ◽  
Author(s):  
N. S. Pradhan ◽  
S. K. Dubey ◽  
A. D. Yadav ◽  
B. K. Panigrahi ◽  
K. G. M. Nair ◽  
...  

Author(s):  
F. Iucolano ◽  
F. Giannazzo ◽  
F. Roccaforte ◽  
V. Puglisi ◽  
M. G. Grimaldi ◽  
...  

1988 ◽  
Vol 100 ◽  
Author(s):  
P. Baeri ◽  
G. Foti ◽  
M. G. Grimaldi ◽  
F. Priolo ◽  
R. Reitano ◽  
...  

ABSTRACTNiSi and Ni2Si layers on silicon substrates as well as high fluence Si(As) ion implanted layers,have been rapidly melted by 30 ns Nd laser pulse irradiation.The energy density ranged between 0.4 and 1.2 J/cm2. Bilayer structures have been observed when the energy density has been chosen properly.Buried epitaxial layers together with an amorphous or a policrystalline layer on top,have been detected by RBS and TEM measurements.


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