Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering
Keyword(s):
2001 ◽
Vol 118
(4)
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pp. 179-182
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2008 ◽
Vol 20
(44)
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pp. 445221
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Keyword(s):
2021 ◽
Vol 532
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pp. 167874
2014 ◽
Vol 601
(1)
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pp. 57-63
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