Processing and characterization of yttrium-stabilized zirconia thin films on polyimide from aqueous polymeric precursors

2004 ◽  
Vol 457 (2) ◽  
pp. 258-263 ◽  
Author(s):  
B.P. Gorman ◽  
H.U. Anderson
Keyword(s):  
Thin Films ◽  
Stabilized Zirconia ◽  
Polymeric Precursors

Special grain boundaries in YBa2Cu3O7-x

1988 ◽  
Vol 46 ◽  
pp. 870-871
Author(s):  
L.A. Tietz ◽  
C.B. Carter ◽  
D.K. Lathrop ◽  
S.E. Russek ◽  
R.A. Buhrman
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Mechanical Stability ◽  
Yttria Stabilized Zirconia ◽  
High Angle ◽  
Stabilized Zirconia ◽  
Routine Manner ◽  
Cubic Materials ◽  
Oriented Single Crystal

Much attention has recently been paid to the characterization of twin boundaries in YBa2Cu3O7-x (YBCO). However, in polycrystalline samples other high-angle grain boundaries may have a much more significant effect on, not only the superconducting behavior, but also the chemical and mechanical stability of the material. In the present study, attention has therefore also been focussed on several types of low-angle and high-angle grain boundaries. Such boundaries are frequently found in thin films of this material which are grown on {001}-oriented, single-crystal yttria-stabilized zirconia (YSZ) or magnesium oxide by electron beam co-evaporation of the metals in an oxygen atmosphere. The fact that over most of the substrate these films are oriented epitactically with respect to the zirconia substrate means that these high-angle grain boundaries can be characterized in a relatively routine manner using selected-area diffraction. The high-angle boundaries observed in this study include those produced by 23.5°, 29°, and 45° rotations about [001] and 90° rotations about [100] or [010]. These boundaries are compared to special high-angle grain boundaries in cubic materials.

scholarly journals Preparation and characterization of epitaxially grown unsupported yttria-stabilized zirconia (YSZ) thin films

2015 ◽  
Vol 331 ◽  
pp. 427-436 ◽  
Author(s):  
Thomas Götsch ◽  
Lukas Mayr ◽  
Michael Stöger-Pollach ◽  
Bernhard Klötzer ◽  
Simon Penner
Keyword(s):  
Thin Films ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia

Physical and electrical characterization of yttrium-stabilized zirconia (YSZ) thin films deposited by sputtering and atomic-layer deposition

2018 ◽  
Vol 29 (18) ◽  
pp. 15349-15357 ◽  
Author(s):  
Joel Molina-Reyes ◽  
Hugo Tiznado ◽  
Gerardo Soto ◽  
Monica Vargas-Bautista ◽  
David Dominguez ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Layer Deposition ◽  
Electrical Characterization ◽  
Atomic Layer ◽  
Stabilized Zirconia ◽  
Layer Deposition

Grain Growth in Nanocrystalline Yttrium-Stabilized Zirconia Thin Films Synthesized by Spin Coating of Polymeric Precursors

2002 ◽  
Vol 2 (2) ◽  
pp. 161-169 ◽  
Author(s):  
Junhang Dong ◽  
Michael Z. Hu ◽  
E. Andrew Payzant ◽  
Timothy R. Armstrong ◽  
Paul F. Becher
Keyword(s):  
Thin Films ◽  
Grain Growth ◽  
Spin Coating ◽  
Stabilized Zirconia ◽  
Polymeric Precursors
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