Preparation and characterization of rf-sputtered Sr-doped lanthanum cuprate thin films on yttria-stabilized zirconia substrates

2005 ◽  
Vol 395 (1-2) ◽  
pp. 286-290 ◽  
Author(s):  
Ho-Chieh Yu ◽  
Yi-Huan Chen ◽  
Cheng-Lung Liao ◽  
Kuan-Zong Fung
Keyword(s):  
Thin Films ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Lanthanum Cuprate

Special grain boundaries in YBa2Cu3O7-x

1988 ◽  
Vol 46 ◽  
pp. 870-871
Author(s):  
L.A. Tietz ◽  
C.B. Carter ◽  
D.K. Lathrop ◽  
S.E. Russek ◽  
R.A. Buhrman
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Mechanical Stability ◽  
Yttria Stabilized Zirconia ◽  
High Angle ◽  
Stabilized Zirconia ◽  
Routine Manner ◽  
Cubic Materials ◽  
Oriented Single Crystal

Much attention has recently been paid to the characterization of twin boundaries in YBa2Cu3O7-x (YBCO). However, in polycrystalline samples other high-angle grain boundaries may have a much more significant effect on, not only the superconducting behavior, but also the chemical and mechanical stability of the material. In the present study, attention has therefore also been focussed on several types of low-angle and high-angle grain boundaries. Such boundaries are frequently found in thin films of this material which are grown on {001}-oriented, single-crystal yttria-stabilized zirconia (YSZ) or magnesium oxide by electron beam co-evaporation of the metals in an oxygen atmosphere. The fact that over most of the substrate these films are oriented epitactically with respect to the zirconia substrate means that these high-angle grain boundaries can be characterized in a relatively routine manner using selected-area diffraction. The high-angle boundaries observed in this study include those produced by 23.5°, 29°, and 45° rotations about [001] and 90° rotations about [100] or [010]. These boundaries are compared to special high-angle grain boundaries in cubic materials.

scholarly journals Preparation and characterization of epitaxially grown unsupported yttria-stabilized zirconia (YSZ) thin films

2015 ◽  
Vol 331 ◽  
pp. 427-436 ◽  
Author(s):  
Thomas Götsch ◽  
Lukas Mayr ◽  
Michael Stöger-Pollach ◽  
Bernhard Klötzer ◽  
Simon Penner
Keyword(s):  
Thin Films ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia

XeCl laser ablative deposition and characterization of yttria‐stabilized zirconia thin films on glass and CeO2‐Sm2O3

1992 ◽  
Vol 72 (2) ◽  
pp. 699-704 ◽  
Author(s):  
F. Kokai ◽  
K. Amano ◽  
H. Ota ◽  
Y. Ochiai ◽  
F. Umemura
Keyword(s):  
Thin Films ◽  
Yttria Stabilized Zirconia ◽  
Xecl Laser ◽  
Stabilized Zirconia

Characterization of single crystal uranium-oxide thin films grown via reactive-gas magnetron sputtering on yttria-stabilized zirconia and sapphire

2012 ◽  
Vol 520 (17) ◽  
pp. 5616-5626 ◽  
Author(s):  
Melissa M. Strehle ◽  
Brent J. Heuser ◽  
Mohamed S. Elbakhshwan ◽  
Xiaochun Han ◽  
David J. Gennardo ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Single Crystal ◽  
Uranium Oxide ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Oxide Thin Films ◽  
Reactive Gas
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