Methyl-terminated Si(111) surface as the ultra thin protection layer to fabricate position-controlled alkyl SAMs by using atomic force microscope anodic oxidation

R Okada; T Miyadera; T Shimada; A Koma; K Ueno; K Saiki

doi:10.1016/j.susc.2004.01.026

Methyl-terminated Si(111) surface as the ultra thin protection layer to fabricate position-controlled alkyl SAMs by using atomic force microscope anodic oxidation

Surface Science ◽

10.1016/j.susc.2004.01.026 ◽

2004 ◽

Vol 552 (1-3) ◽

pp. 46-52 ◽

Cited By ~ 9

Author(s):

R Okada ◽

T Miyadera ◽

T Shimada ◽

A Koma ◽

K Ueno ◽

...

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Atomic Force ◽

Protection Layer

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The influence of sample conductivity on local anodic oxidation by the tip of atomic force microscope

Journal of Applied Physics ◽

10.1063/1.2794374 ◽

2007 ◽

Vol 102 (7) ◽

pp. 074315 ◽

Cited By ~ 10

Author(s):

Vladimír Cambel ◽

Ján Šoltýs

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Atomic Force ◽

Local Anodic Oxidation

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Nanolithography by local anodic oxidation of metal films using an atomic force microscope

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/s1386-9477(98)00153-2 ◽

1998 ◽

Vol 2 (1-4) ◽

pp. 748-752 ◽

Cited By ~ 41

Author(s):

R Held ◽

T Heinzel ◽

P Studerus ◽

K Ensslin

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Metal Films ◽

Atomic Force ◽

Local Anodic Oxidation

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Patterning surface oxide nanostructures using atomic force microscope local anodic oxidation

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2007.08.085 ◽

2008 ◽

Vol 40 (6) ◽

pp. 1941-1943 ◽

Cited By ~ 4

Author(s):

Tae Young Kim ◽

Ermanno Di Zitti ◽

Davide Ricci ◽

Silvano Cincotti

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Surface Oxide ◽

Atomic Force ◽

Oxide Nanostructures ◽

Local Anodic Oxidation

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Anodic Oxidation Technique using an Atomic Force Microscope to Fabricate a Single-Electron Device for a Radiation Imaging Detector

Journal of Nuclear Science and Technology ◽

10.1080/00223131.2008.10875981 ◽

2008 ◽

Vol 45 (sup6) ◽

pp. 78-80

Author(s):

Toshio Hirano ◽

Teruhisa Matsui ◽

Jun Kawarabayashi ◽

Tetsuo Iguchi

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Single Electron ◽

Electron Device ◽

Radiation Imaging ◽

Atomic Force ◽

Imaging Detector ◽

Single Electron Device ◽

Anodic Oxidation Technique

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Erratum to: “Formation of Nanostructures in a Heterojunction with a Deeply Located 2D Electron Gas via the Method of High-Voltage Anodic-Oxidation Lithography Using an Atomic-Force Microscope”

Instruments and Experimental Techniques ◽

10.1134/s0020441208050242 ◽

2008 ◽

Vol 51 (5) ◽

pp. 779-779

Author(s):

M. Yu. Mel’nikov ◽

V. S. Khrapai ◽

D. Schuh

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

High Voltage ◽

Electron Gas ◽

2D Electron Gas ◽

Atomic Force

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Nanoscale Dot Patterning by Anodic Oxidation with Atomic Force Microscope

2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems ◽

10.1109/nems.2007.352184 ◽

2007 ◽

Author(s):

I. Sramala ◽

T. Jafferi ◽

A. Trithong ◽

A. Klamcheun ◽

S. Pratontep

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Atomic Force

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Tip-induced local anodic oxidation on the nativeSiO2layer of Si(111) using an atomic force microscope

Physical Review B ◽

10.1103/physrevb.64.195324 ◽

2001 ◽

Vol 64 (19) ◽

Cited By ~ 30

Author(s):

Y.-R. Ma ◽

C. Yu ◽

Y.-D. Yao ◽

Y. Liou ◽

S.-F. Lee

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Atomic Force ◽

Local Anodic Oxidation

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Formation of nanostructures in a heterojunction with a deeply located 2D electron gas via the method of high-voltage anodic-oxidation lithography using an atomic-force microscope

Instruments and Experimental Techniques ◽

10.1134/s0020441208040209 ◽

2008 ◽

Vol 51 (4) ◽

pp. 617-624 ◽

Cited By ~ 2

Author(s):

M. Yu. Mel’nikov ◽

V. S. Khrapai ◽

D. Schuh

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

High Voltage ◽

Electron Gas ◽

2D Electron Gas ◽

Atomic Force

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Local anodic oxidation of superconducting NbN thin films by an atomic force microscope

Superconductor Science and Technology ◽

10.1088/0953-2048/22/12/125027 ◽

2009 ◽

Vol 22 (12) ◽

pp. 125027 ◽

Cited By ~ 1

Author(s):

X Y Yang ◽

L X You ◽

X Wang ◽

L B Zhang ◽

L Kang ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscope ◽

Anodic Oxidation ◽

Atomic Force ◽

Local Anodic Oxidation

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Atomic force microscope anodic oxidation studied by spectroscopic microscopy

Applied Physics Letters ◽

10.1063/1.1509121 ◽

2002 ◽

Vol 81 (15) ◽

pp. 2842-2844 ◽

Cited By ~ 34

Author(s):

M. Lazzarino ◽

S. Heun ◽

B. Ressel ◽

K. C. Prince ◽

P. Pingue ◽

...

Keyword(s):

Atomic Force Microscope ◽

Anodic Oxidation ◽

Atomic Force

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