Characterization of wide-band-gap semiconductors (GaN, SiC) by defect-selective etching and complementary methods

2006 ◽  
Vol 40 (4-6) ◽  
pp. 279-288 ◽  
Author(s):  
J.L. Weyher
Author(s):  
R.J. Graham

As a characterization technique for semiconductors, cathodoluminescence (CL) performed in TEM has several useful advantages over the more common SEM-based technique, the most important being that the acquisition of CL data from localized regions in an electron transparent specimen allows a correlation of microstructural and optical/electronic information. For example, it is possible to determine the distribution of low concentrations of optically active impurities and their possible association with defects, often at submicron resolution. Examples of TEM CL as a method of characterizing defects in semiconducting materials presented here are taken from wide band gap materials which are of current interest including CVD-grown diamond films and β-GaN on Si.


2013 ◽  
Vol 28 (6) ◽  
pp. 671-676 ◽  
Author(s):  
Yu-Qing ZHANG ◽  
Li-Li ZHAO ◽  
Shi-Long XU ◽  
Chao ZHANG ◽  
Xiao-Ying CHEN ◽  
...  

2009 ◽  
Vol 95 (17) ◽  
pp. 172109 ◽  
Author(s):  
Anderson Janotti ◽  
Eric Snow ◽  
Chris G. Van de Walle

2014 ◽  
Vol 43 (25) ◽  
pp. 9620-9632 ◽  
Author(s):  
T. O. L. Sunde ◽  
M. Lindgren ◽  
T. O. Mason ◽  
M.-A. Einarsrud ◽  
T. Grande

Wide band-gap semiconductors doped with luminescent rare earth elements (REEs) have attracted recent interest due to their unique optical properties.


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