Black silicon layer formation for application in solar cells

2006 ◽  
Vol 90 (18-19) ◽  
pp. 3085-3093 ◽  
Author(s):  
J.S. Yoo ◽  
I.O. Parm ◽  
U. Gangopadhyay ◽  
Kyunghae Kim ◽  
S.K. Dhungel ◽  
...  
2003 ◽  
Vol 4 (5) ◽  
pp. 10-14
Author(s):  
U. Gangopadhyay ◽  
Kyung-Hae Kim ◽  
S.K. Dhungel ◽  
D. Mangalaraj ◽  
J.H. Park ◽  
...  

2016 ◽  
Vol 9 (9) ◽  
pp. 092301 ◽  
Author(s):  
Takahito Nishimura ◽  
Soma Toki ◽  
Hiroki Sugiura ◽  
Kazuyoshi Nakada ◽  
Akira Yamada

2015 ◽  
Vol 1770 ◽  
pp. 7-12 ◽  
Author(s):  
Henriette A. Gatz ◽  
Yinghuan Kuang ◽  
Marcel A. Verheijen ◽  
Jatin K. Rath ◽  
Wilhelmus M.M. (Erwin) Kessels ◽  
...  

ABSTRACTSilicon heterojunction solar cells (SHJ) with thin intrinsic layers are well known for their high efficiencies. A promising way to further enhance their excellent characteristics is to enable more light to enter the crystalline silicon (c-Si) absorber of the cell while maintaining a simple cell configuration. Our approach is to replace the amorphous silicon (a-Si:H) emitter layer with a more transparent nanocrystalline silicon oxide (nc-SiOx:H) layer. In this work, we focus on optimizing the p-type nc-SiOx:H material properties, grown by radio frequency plasma enhanced chemical vapor deposition (rf PECVD), on an amorphous silicon layer.20 nm thick nanocrystalline layers were successfully grown on a 5 nm a-Si:H layer. The effect of different ratios of trimethylboron to silane gas flow rates on the material properties were investigated, yielding an optimized material with a conductivity in the lateral direction of 7.9×10-4 S/cm combined with a band gap of E04 = 2.33 eV. Despite its larger thickness as compared to a conventional window a-Si:H p-layer, the novel layer stack of a-Si:H(i)/nc-SiOx:H(p) shows significantly enhanced transmission compared to the stack with a conventional a-Si:H(p) emitter. Altogether, the chosen material exhibits promising characteristics for implementation in SHJ solar cells.


2016 ◽  
Vol 24 (18) ◽  
pp. A1224 ◽  
Author(s):  
Jae-Won Song ◽  
Yoon-Ho Nam ◽  
Min-Joon Park ◽  
Bongyoung Yoo ◽  
Jun-Sik Cho ◽  
...  

2017 ◽  
Vol 68 (7) ◽  
pp. 53-57 ◽  
Author(s):  
Martin Kopani ◽  
Milan Mikula ◽  
Daniel Kosnac ◽  
Jan Gregus ◽  
Emil Pincik

AbstractThe morphology and chemical bods of p-type and n-type porous Si was compared. The surface of n-type sample is smooth, homogenous without any features. The surface of p-type sample reveals micrometer-sized islands. FTIR investigation reveals various distribution of SiOxHycomplexes in both p-and n-type samples. From the conditions leading to porous silicon layer formation (the presence of holes) we suggest both SiOxHyand SiFxHycomplexes in the layer.


2021 ◽  
Vol 233 ◽  
pp. 111409
Author(s):  
Jiahui Xu ◽  
Cheng Chen ◽  
Cui Liu ◽  
Jia Chen ◽  
Zhifeng Liu ◽  
...  

Energies ◽  
2019 ◽  
Vol 12 (8) ◽  
pp. 1495 ◽  
Author(s):  
Forniés ◽  
Ceccaroli ◽  
Méndez ◽  
Souto ◽  
Pérez Vázquez ◽  
...  

For more than 15 years FerroAtlantica (now Ferroglobe) has been developing a method of silicon purification to obtain Upgraded Metallurgical Grade Silicon (UMG-Si) for PV solar application without blending. After many improvements and optimizations, the final process has clearly demonstrated its validity in terms of quality and costs. In this paper the authors present new results stemming from a first mass-production campaign and a detailed description of the purification process that results in the tested UMG-Si. The subsequent steps in the value chain for the wafer, cell and module manufacturing are also described. Two independent companies, among the Tier-1 solar cells producers, were selected for the industrial test, each using a different solar cell technology: Al-BSF and black silicon + PERC. Cells and modules were manufactured in conventional production lines and their performances compared to those obtained with standard polysilicon wafers produced in the same lines and periods. Thus, for Al-BSF technology, the average efficiency of solar cells obtained with UMG-Si was (18.4 ± 0.4)% compared to 18.49% obtained with polysilicon-made wafers. In the case of black silicon + PERC, the average efficiency obtained with UMG-Si was (20.1 ± 0.6)%, compared to 20.41% for polysilicon multicrystalline wafers.


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