Uncertain accelerated degradation modeling and analysis considering epistemic uncertainties in time and unit dimension

2020 ◽  
Vol 201 ◽  
pp. 106967 ◽  
Author(s):  
Ji-Peng Wu ◽  
Rui Kang ◽  
Xiao-Yang Li
Keyword(s):  
Modeling And Analysis ◽  
Unit Dimension ◽  
Accelerated Degradation ◽  
Degradation Modeling

RETRACTED: A Review on Modeling and Analysis of Accelerated Degradation Data for Reliability Assessment

2020 ◽  
Vol 107 ◽  
pp. 113602 ◽  
Author(s):  
Zhenan Pang ◽  
XiaoSheng Si ◽  
Changhua Hu ◽  
Jianxun Zhang ◽  
Hong Pei
Keyword(s):  
Reliability Assessment ◽  
Modeling And Analysis ◽  
Accelerated Degradation ◽  
Degradation Data

Reliability prediction of rotary encoder based on multivariate accelerated degradation modeling

Measurement ◽  
2020 ◽  
Vol 152 ◽  
pp. 107395 ◽  
Author(s):  
Zhaojun Yang ◽  
Shizheng Li ◽  
Chuanhai Chen ◽  
Heng Mei ◽  
Yonggang Liu
Keyword(s):  
Reliability Prediction ◽  
Rotary Encoder ◽  
Accelerated Degradation ◽  
Degradation Modeling

scholarly journals Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

2016 ◽  
Vol 154 ◽  
pp. 152-159 ◽  
Author(s):  
Jianlin Huang ◽  
Dušan S Golubović ◽  
Sau Koh ◽  
Daoguo Yang ◽  
Xiupeng Li ◽  
...  
Keyword(s):  
White Light ◽  
Accelerated Degradation ◽  
Degradation Modeling ◽  
Degradation Test ◽  
Accelerated Degradation Test

scholarly journals Pavement Marking Degradation Modeling and Analysis

2009 ◽  
Vol 15 (3) ◽  
pp. 190-199 ◽  
Author(s):  
William E. Sitzabee ◽  
Joseph E. Hummer ◽  
William Rasdorf
Keyword(s):  
Modeling And Analysis ◽  
Degradation Modeling ◽  
Pavement Marking

Accelerated Degradation Modeling and Statistical Analysis of MEMS Device Based on Competing Failure

2012 ◽  
Vol 531-532 ◽  
pp. 580-583
Author(s):  
Qing Xia ◽  
Zong Jie Cao ◽  
Yuan Da Wang ◽  
Peng Sun
Keyword(s):  
Parameter Estimation ◽  
Reliability Analysis ◽  
Failure Modes ◽  
Reliability Function ◽  
Accelerated Life Test ◽  
Mems Devices ◽  
Accelerated Degradation ◽  
Degradation Modeling ◽  
Degradation Failure ◽  
Mems Device

Traditional reliability analysis of MEMS devices is based on only one failure mode, but paroxysmal failure and degradation failure are simultaneous on one MEMS device which is called as competing failure modes. Accelerated degradation modeling and parameter estimation based on competing failure modes are elementary contents of reliability analysis, in which paroxysmal failure and degradation failure are integrated in the process of educing reliability function, and elementary theories of reliability and statistics are used. The method of accelerated degradation modeling and parameter estimation is proved to be precise in a simulation of accelerated life test on a kind of MEMS device which have the two failure modes: paroxysmal failure and degradation failure, and they are have relations with stress variable: current.

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