Atomic scale characterization of the conformational dynamics of a thermo-sensitive and a non-thermo-sensitive oligomer using vibrational spectra obtained from molecular dynamics

Polymer ◽  
2012 ◽  
Vol 53 (6) ◽  
pp. 1306-1320 ◽  
Author(s):  
Sanket A. Deshmukh ◽  
Subramanian K.R.S. Sankaranarayanan ◽  
Derrick C. Mancini
Keyword(s):  
Molecular Dynamics ◽  
Vibrational Spectra ◽  
Conformational Dynamics ◽  
Atomic Scale ◽  
Scale Characterization

scholarly journals Atomic-scale characterization of occurring phenomena during hot nanometric cutting of single crystal 3C–SiC

RSC Advances ◽  
2016 ◽  
Vol 6 (75) ◽  
pp. 71409-71424 ◽  
Author(s):  
Saeed Zare Chavoshi ◽  
Xichun Luo
Keyword(s):  
Molecular Dynamics ◽  
Single Crystal ◽  
Md Simulation ◽  
Atomic Scale ◽  
Nanometric Cutting ◽  
Crystal Orientations ◽  
Scale Characterization

Nanometric cutting of single crystal 3C–SiC on the three principal crystal orientations at various cutting temperatures spanning from 300 K to 3000 K was investigated by the use of molecular dynamics (MD) simulation.

Atomic scale characterization of GaInN/GaN multiple quantum wells in V-shaped pits

2011 ◽  
Vol 98 (18) ◽  
pp. 181904 ◽  
Author(s):  
Shigetaka Tomiya ◽  
Yuya Kanitani ◽  
Shinji Tanaka ◽  
Tadakatsu Ohkubo ◽  
Kazuhiro Hono
Keyword(s):  
Quantum Wells ◽  
Atomic Scale ◽  
Multiple Quantum Wells ◽  
Multiple Quantum ◽  
Scale Characterization

scholarly journals Combined Macroscopic, Nanoscopic, and Atomic-Scale Characterization of Gold-Ruthenium Bimetallic Catalysts for Octanol Oxidation

2016 ◽  
Vol 33 (7) ◽  
pp. 419-437 ◽  
Author(s):  
Lidia E. Chinchilla ◽  
Carol Olmos ◽  
Mert Kurttepeli ◽  
Sara Bals ◽  
Gustaaf Van Tendeloo ◽  
...  
Keyword(s):  
Bimetallic Catalysts ◽  
Atomic Scale ◽  
Scale Characterization

Atomic Scale Characterization of the Pt/TiO2; Interface

2004 ◽  
Vol 10 (S02) ◽  
pp. 452-453
Author(s):  
Hakim Iddir ◽  
Mark Disko ◽  
Nigel D. Browning ◽  
Serdar Ogut
Keyword(s):  
Atomic Scale ◽  
Scale Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic-scale characterization of the interfacial phonon in graphene/SiC

2017 ◽  
Vol 96 (15) ◽  
Author(s):  
Emi Minamitani ◽  
Ryuichi Arafune ◽  
Thomas Frederiksen ◽  
Tetsuya Suzuki ◽  
Syed Mohammad Fakruddin Shahed ◽  
...  
Keyword(s):  
Atomic Scale ◽  
Scale Characterization

Atomic-scale characterization of theSrTiO3Σ3(112)[1¯10]grain boundary

2010 ◽  
Vol 81 (13) ◽  
Author(s):  
K. J. Dudeck ◽  
N. A. Benedek ◽  
M. W. Finnis ◽  
D. J. H. Cockayne
Keyword(s):  
Grain Boundary ◽  
Atomic Scale ◽  
Scale Characterization

scholarly journals Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

2008 ◽  
Vol 16 (4) ◽  
pp. 42-47 ◽  
Author(s):  
Brian P. Gorman ◽  
David Diercks ◽  
Norman Salmon ◽  
Eric Stach ◽  
Gonzalo Amador ◽  
...  
Keyword(s):  
A Priori ◽  
Atom Probe ◽  
Atomic Scale ◽  
Original Position ◽  
3 Dimensional ◽  
Original Specimen ◽  
High Electrical Field ◽  
Scale Characterization ◽  
Surface Monolayers

Atom probe tomography has primarily been used for atomic scale characterization of high electrical conductivity materials. A high electrical field applied to needle-shaped specimens evaporates surface atoms, and a time of flight measurement determines each atom's identity. A 2-dimensional detector determines each atom's original position on the specimen. When repeated successively over many surface monolayers, the original specimen can be reconstructed into a 3-dimensional representation. In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy.

Atomic scale characterization of point and extended defects in niobate thin films

2019 ◽  
Vol 203 ◽  
pp. 82-87 ◽  
Author(s):  
Changjian Li ◽  
Dongsheng Song ◽  
Mengsha Li ◽  
Chunhua Tang ◽  
Deqing Xue ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Extended Defects ◽  
Scale Characterization
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