scholarly journals Combined Macroscopic, Nanoscopic, and Atomic-Scale Characterization of Gold-Ruthenium Bimetallic Catalysts for Octanol Oxidation

2016 ◽  
Vol 33 (7) ◽  
pp. 419-437 ◽  
Author(s):  
Lidia E. Chinchilla ◽  
Carol Olmos ◽  
Mert Kurttepeli ◽  
Sara Bals ◽  
Gustaaf Van Tendeloo ◽  
...  
Keyword(s):  
Bimetallic Catalysts ◽  
Atomic Scale ◽  
Scale Characterization

Atomic scale characterization of GaInN/GaN multiple quantum wells in V-shaped pits

2011 ◽  
Vol 98 (18) ◽  
pp. 181904 ◽  
Author(s):  
Shigetaka Tomiya ◽  
Yuya Kanitani ◽  
Shinji Tanaka ◽  
Tadakatsu Ohkubo ◽  
Kazuhiro Hono
Keyword(s):  
Quantum Wells ◽  
Atomic Scale ◽  
Multiple Quantum Wells ◽  
Multiple Quantum ◽  
Scale Characterization

Atomic Scale Characterization of the Pt/TiO2; Interface

2004 ◽  
Vol 10 (S02) ◽  
pp. 452-453
Author(s):  
Hakim Iddir ◽  
Mark Disko ◽  
Nigel D. Browning ◽  
Serdar Ogut
Keyword(s):  
Atomic Scale ◽  
Scale Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic-scale characterization of the interfacial phonon in graphene/SiC

2017 ◽  
Vol 96 (15) ◽  
Author(s):  
Emi Minamitani ◽  
Ryuichi Arafune ◽  
Thomas Frederiksen ◽  
Tetsuya Suzuki ◽  
Syed Mohammad Fakruddin Shahed ◽  
...  
Keyword(s):  
Atomic Scale ◽  
Scale Characterization

Atomic-scale characterization of theSrTiO3Σ3(112)[1¯10]grain boundary

2010 ◽  
Vol 81 (13) ◽  
Author(s):  
K. J. Dudeck ◽  
N. A. Benedek ◽  
M. W. Finnis ◽  
D. J. H. Cockayne
Keyword(s):  
Grain Boundary ◽  
Atomic Scale ◽  
Scale Characterization

scholarly journals Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

2008 ◽  
Vol 16 (4) ◽  
pp. 42-47 ◽  
Author(s):  
Brian P. Gorman ◽  
David Diercks ◽  
Norman Salmon ◽  
Eric Stach ◽  
Gonzalo Amador ◽  
...  
Keyword(s):  
A Priori ◽  
Atom Probe ◽  
Atomic Scale ◽  
Original Position ◽  
3 Dimensional ◽  
Original Specimen ◽  
High Electrical Field ◽  
Scale Characterization ◽  
Surface Monolayers

Atom probe tomography has primarily been used for atomic scale characterization of high electrical conductivity materials. A high electrical field applied to needle-shaped specimens evaporates surface atoms, and a time of flight measurement determines each atom's identity. A 2-dimensional detector determines each atom's original position on the specimen. When repeated successively over many surface monolayers, the original specimen can be reconstructed into a 3-dimensional representation. In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy.

Atomic scale characterization of point and extended defects in niobate thin films

2019 ◽  
Vol 203 ◽  
pp. 82-87 ◽  
Author(s):  
Changjian Li ◽  
Dongsheng Song ◽  
Mengsha Li ◽  
Chunhua Tang ◽  
Deqing Xue ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Extended Defects ◽  
Scale Characterization

Atomic scale characterization of organometallic vapor phase epitaxial growth using in-situ grazing incidence X-ray scattering

1992 ◽  
Vol 124 (1-4) ◽  
pp. 1-9 ◽  
Author(s):  
D.W. Kisker ◽  
G.B. Stephenson ◽  
P.H. Fuoss ◽  
F.J. Lamelas ◽  
S. Brennan ◽  
...  
Keyword(s):  
Epitaxial Growth ◽  
Vapor Phase ◽  
Grazing Incidence ◽  
Atomic Scale ◽  
X Ray ◽  
X Ray Scattering ◽  
Scale Characterization ◽  
Ray Scattering

scholarly journals Atomic-Scale Characterization of Graphene p–n Junctions for Electron-Optical Applications

ACS Nano ◽  
2019 ◽  
Author(s):  
Xiaodong Zhou ◽  
Alexander Kerelsky ◽  
Mirza M. Elahi ◽  
Dennis Wang ◽  
K. M. Masum Habib ◽  
...  
Keyword(s):  
Atomic Scale ◽  
Optical Applications ◽  
Scale Characterization
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