Reverse draining of a magnetic soap film — Analysis and simulation of a thin film equation with non-uniform forcing

2009 ◽  
Vol 238 (22) ◽  
pp. 2153-2165 ◽  
Author(s):  
D.E. Moulton ◽  
J. Lega
Keyword(s):  
Thin Film ◽  
Soap Film ◽  
Film Analysis ◽  
Thin Film Equation

Acquisition of Surface/Thin Film Analysis System

2002 ◽  
Author(s):  
James Stoffer ◽  
George D. Weddill ◽  
Thomas O'Keefe ◽  
Richard Brow ◽  
Matt O'Keefe
Keyword(s):  
Thin Film ◽  
Film Analysis ◽  
Thin Film Analysis ◽  
Analysis System

scholarly journals Non-negative Martingale Solutions to the Stochastic Thin-Film Equation with Nonlinear Gradient Noise

2021 ◽  
Author(s):  
Konstantinos Dareiotis ◽  
Benjamin Gess ◽  
Manuel V. Gnann ◽  
Günther Grün
Keyword(s):  
Thin Film ◽  
Energy Estimates ◽  
Approximation Procedure ◽  
Thin Film Flow ◽  
Thin Film Equations ◽  
Scalar Conservation Law ◽  
Thin Film Equation ◽  
Degenerate Parabolic ◽  
Scalar Conservation ◽  
Martingale Solutions

AbstractWe prove the existence of non-negative martingale solutions to a class of stochastic degenerate-parabolic fourth-order PDEs arising in surface-tension driven thin-film flow influenced by thermal noise. The construction applies to a range of mobilites including the cubic one which occurs under the assumption of a no-slip condition at the liquid-solid interface. Since their introduction more than 15 years ago, by Davidovitch, Moro, and Stone and by Grün, Mecke, and Rauscher, the existence of solutions to stochastic thin-film equations for cubic mobilities has been an open problem, even in the case of sufficiently regular noise. Our proof of global-in-time solutions relies on a careful combination of entropy and energy estimates in conjunction with a tailor-made approximation procedure to control the formation of shocks caused by the nonlinear stochastic scalar conservation law structure of the noise.

Depth microscopy for thin film analysis

1993 ◽  
Vol 334 (1) ◽  
pp. 187-190 ◽  
Author(s):  
G. Dollinger ◽  
M. Boulouednine ◽  
T. Faestermann ◽  
P. Maier-Komor
Keyword(s):  
Thin Film ◽  
Film Analysis ◽  
Thin Film Analysis

Applications of microfocussed ion beams in surface and thin film analysis

Vacuum ◽  
1987 ◽  
Vol 37 (3-4) ◽  
pp. 289-291 ◽  
Author(s):  
RE Thurstans ◽  
J Wolstenholme
Keyword(s):  
Thin Film ◽  
Ion Beams ◽  
Film Analysis ◽  
Thin Film Analysis

MULTILAYER THIN‐FILM ANALYSIS BY ION BACKSCATTERING

1971 ◽  
Vol 18 (5) ◽  
pp. 191-194 ◽  
Author(s):  
S. T. Picraux ◽  
F. L. Vook
Keyword(s):  
Thin Film ◽  
Multilayer Thin Film ◽  
Film Analysis ◽  
Thin Film Analysis ◽  
Ion Backscattering

Significance of the channeling surface peak in thin‐film analysis

1978 ◽  
Vol 32 (2) ◽  
pp. 93-94 ◽  
Author(s):  
Robert L. Kauffman ◽  
L. C. Feldman ◽  
P. J. Silverman ◽  
R. A. Zuhr
Keyword(s):  
Thin Film ◽  
Film Analysis ◽  
Thin Film Analysis
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