Influence of structural disorder on low-temperature behavior of penetration depth in electron-doped high-TC thin films
2006 ◽
Vol 450
(1-2)
◽
pp. 40-44
◽
Keyword(s):
1990 ◽
pp. 217-222
1994 ◽
Vol 235-240
◽
pp. 1837-1838
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1998 ◽
Vol 5
(4-6)
◽
pp. 847-858
◽
Keyword(s):
1995 ◽
Vol 56
(12)
◽
pp. 1725-1726
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Keyword(s):