Dielectric resonator for measuring the magnetic penetration depth at low temperature in high‐Tc superconducting thin films

1995 ◽  
Vol 66 (11) ◽  
pp. 5282-5287
Author(s):  
A. P. Mourachkine
1994 ◽  
Vol 235-240 ◽  
pp. 1837-1838 ◽  
Author(s):  
A. Andreone ◽  
A. Cassinese ◽  
A. Del Vecchio ◽  
A. Di Chiara ◽  
F. Miletto Granozio ◽  
...  

1994 ◽  
Vol 16 (10-11) ◽  
pp. 1909-1915
Author(s):  
A. Andreone ◽  
A. Cassinese ◽  
C. Cantoni ◽  
A. Di Chiara ◽  
F. Miletto Granozio ◽  
...  

1991 ◽  
Vol 169 (1-4) ◽  
pp. 671-672 ◽  
Author(s):  
S.M. Anlage ◽  
B.W. Langley ◽  
G. Deutscher ◽  
R.W. Simon ◽  
J.M. Murduck ◽  
...  

1990 ◽  
Vol 195 ◽  
Author(s):  
Steven M. Anlage ◽  
Brian W. Langley ◽  
Jurgen Halbritter ◽  
Chang-Beom Eom ◽  
Neil Switz ◽  
...  

ABSTRACTThe microstrip resonator technique has been applied to study the temperature dependence of the magnetic penetration depth in high quality YBa2Cu3O7−δ thin films. The temperature dependence at low temperatures comes out directly from measured data, with no assumptions about transmission line geometry, dielectric properties, or a model for the temperature dependence of the penetration depth. One can interpret the data in terms of either an exponential decay of λ(T) at low temperatures or as a power law decay. The energy gaps obtained from the exponential decay at low temperature are found to be significantly smaller than weak coupled BCS theory and power-law exponents are in the range of 1.3 to 3.2. These results will be discussed in terms of microscopic theories and the possibility that materials properties dominate the measurement.


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