Investigation of magnetic properties of MgB2 thin films on NbN/Si substrate

2004 ◽  
Vol 412-414 ◽  
pp. 201-205 ◽  
Author(s):  
Akihiko Nishida ◽  
Chihiro Taka ◽  
Stefan Chromik ◽  
Rudolf Durny
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Si Substrate ◽  
Mgb2 Thin Films

Preparation and magnetic properties of the CoFe2O4 thin films on Si substrate by sol-gel technique

2005 ◽  
Vol 40 (16) ◽  
pp. 4169-4172 ◽  
Author(s):  
Nimai Chand Pramanik ◽  
Tatsuo FujiI ◽  
Makoto Nakanishi ◽  
Jun Takada
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Sol Gel ◽  
Si Substrate ◽  
Gel Technique

Epitaxial Growth and Magnetic Behavior of (Ni,Zn)Fe2O4 Thin Films on Si Substrate Using Designed Buffer Layers for Novel Memory Application

2002 ◽  
Vol 747 ◽  
Author(s):  
Naoki Wakiya ◽  
Kazuo Shinozaki ◽  
Nobuyasu Mizutani
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Remanent Magnetization ◽  
Zinc Ferrite ◽  
Lattice Mismatch ◽  
Magnetic Behavior ◽  
Buffer Layers ◽  
Si Substrate ◽  
Antiphase Boundaries ◽  
Nickel Zinc

ABSTRACTEpitaxial nickel zinc ferrite (Ni,Zn)Fe2O4 (NZF) thin films were successfully deposited on (MgO-Al2O3)/CeO2/YSZ/Si(001) substrates, where (MgO-Al2O3) is MgO doped with Al2O3. The crystallographic orientation and magnetic properties (saturation magnetization: Ms, and squareness: Mr/Ms where Mr is remanent magnetization) of NZF thin films were considerably changed with the amount of Al2O3 addition. If the amount of Al2O3 addition was less than 7 mol%, (001)-oriented epitaxial NZF thin films were obtained and the films had low squareness (around 45%). If the amount of Al2O3 addition was more than 7 mol%, (111)-oriented epitaxial NZF thin films were obtained and the films had high squareness (around 60–81%). Maximum squareness (81%) was obtained if the amount of Al2O3 addition was 26 mol%. For the sample with this Al2O3 content, the lattice mismatch between NZF and (MgO-Al2O3) buffer layer was 3.2%. The fact that high squareness was not obtained if lattice mismatch was very small (-0.3% on MgO) but obtained if lattice mismatch was 3.2% suggests that lattice mismatch to a certain content is important to avoid the formation of antiphase boundaries (APBs). This consideration was confirmed by examining other buffer layers having various lattice mismatches with NZF.

scholarly journals Effect of thickness and Si substrate morphology in La0.7Sr0.3MnO3/Si thin films

2014 ◽  
Vol 70 (a1) ◽  
pp. C1532-C1532
Author(s):  
Hsiao-Tsu Wang ◽  
Mau- Kuen Wu ◽  
Yu-Cheng Shao ◽  
Yu-Fu Wang ◽  
Shang-Hsien Hsieh ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Electronic Structures ◽  
Magnetic Circular Dichroism ◽  
Magnetic Behavior ◽  
Si Substrate ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption ◽  
Different Thickness

Investigation has been made on atomic, electronic structures and magnetic properties of La0.7Sr0.3MnO3 (LSMO) on Si substrate. The effect of different thickness of LSMO and different morphological [flat and nano-pyramid (NP)] of Si substrate are studied in present work. The result of Mn K-edge extended x-ray absorption fine structure indicates the more disorder of local atomic structure of first shell (Mn-O bound) in the thinner LSMO/Si film. The Mn L3,2-edge x-ray absorption near-edge structure shows the presence of Mn2+ ion on the sample. Furthermore, the Mn L3,2-edge x-ray magnetic circular dichroism reveals that the thinner film (LSMO/Si) has highest magnetic moment, in comparison to that of thick LSMO/Si and LSMO/Si-NP samples. This finding suggests that the appearance Mn2+ may play an important role in magnetic behavior of hetero-junction LSMnO/Si and Si-NP.

The microstructure and magnetic properties of Co2MnSi thin films deposited on Si substrate

2017 ◽  
Vol 723 ◽  
pp. 188-191 ◽  
Author(s):  
Fujun Yang ◽  
Wanjun Li ◽  
Jihui Li ◽  
Hongbo Chen ◽  
Degao Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Si Substrate ◽  
Microstructure And Magnetic Properties

Microstructure and magnetic properties dependence on the thickness of Tb x Dy 1−x Fe 2 thin films sputtered on Pt/TiO 2 /SiO 2 /Si substrate

2017 ◽  
Vol 623 ◽  
pp. 138-146 ◽  
Author(s):  
Joris More-Chevalier ◽  
Christophe Cibert ◽  
Bernadette Domengès ◽  
Anthony Ferri ◽  
Rachel Desfeux ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Si Substrate ◽  
Microstructure And Magnetic Properties

Enhancement of Jc in MgB2 thin films on Si substrate with pinning centers introduced by deposition in O2 atmosphere

2007 ◽  
Vol 102 (7) ◽  
pp. 076114 ◽  
Author(s):  
M. Haruta ◽  
T. Fujiyoshi ◽  
R. Kajita ◽  
K. Yonekura ◽  
T. Sueyoshi ◽  
...  
Keyword(s):  
Thin Films ◽  
Si Substrate ◽  
Pinning Centers ◽  
Mgb2 Thin Films

Thickness Dependence of Magnetic Properties of Co90Fe10 Nanoscale Thin Films

2008 ◽  
Vol 8 (2) ◽  
pp. 841-845 ◽  
Author(s):  
O. Yalçin ◽  
S. Kazan ◽  
R. Şahingöz ◽  
F. Yıldız ◽  
Y. Yerli ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Room Temperature ◽  
Resonance Field ◽  
Thickness Dependence ◽  
Si Substrate ◽  
Damping Term ◽  
Individual Layer ◽  
X Band ◽  
Effective Magnetization

Ferromagnetic monolayers Co90Fe10 thin films with individual layer thicknesses 2, 6, and 8 nm were grown on thermally oxidized Si substrate and magnetic properties of these were investigated with Ferromagnetic resonance (FMR) technique at room temperature. The magnetoresistance (MR) of the samples were measured as a function of applied DC magnetic field and the thickness dependence of the MR was plotted. The FMR spectra were recorded for both parallel and perpendicular geometry. The X-band (9.5 GHz) FMR spectra and resonance field of samples were analyzed and fitted theoretically by using the Landau-Lifshits dynamic equation of motion for magnetization with the Bloch-Bloembergen type damping term. The computer programs have been written to extract the effective magnetization (M), g-values and spin–spin relaxation time (T2) fitting parameters. The thickness dependence of magnetic parameters has been obtained from experimental data by mean of a theoretical model.

Investigation of lower critical fields of MgB2 thin films on SiC/Si substrate with parallel magnetic fields

2006 ◽  
Vol 435 (1-2) ◽  
pp. 74-77 ◽  
Author(s):  
Akihiko Nishida ◽  
Chihiro Taka ◽  
Stefan Chromik ◽  
Rudolf Durny
Keyword(s):  
Thin Films ◽  
Magnetic Fields ◽  
Si Substrate ◽  
Critical Fields ◽  
Mgb2 Thin Films ◽  
Parallel Magnetic Fields

Magnetic properties and microstructure of TbxDy1−xFe2 thin films sputtered on Pt/TiO2/SiO2/Si substrate

2013 ◽  
Vol 273 ◽  
pp. 645-651 ◽  
Author(s):  
Jiang Zhu ◽  
Christophe Cibert ◽  
Bernadette Domenges ◽  
Rachid Bouregba ◽  
Gilles Poullain
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Si Substrate
Sign in / Sign up

Export Citation Format

Share Document