Conceptual design of a new high-resolution powder diffractometer at Jordan Research and Training Reactor

2018 ◽  
Vol 551 ◽  
pp. 390-394
Author(s):  
Saed Almomani ◽  
Baek-Seok Seong
2013 ◽  
Author(s):  
Cynthia S. Froning ◽  
Steven Osterman ◽  
Eric Burgh ◽  
Matthew Beasley ◽  
Paul Scowen ◽  
...  

2000 ◽  
Vol 321-324 ◽  
pp. 308-313 ◽  
Author(s):  
A.I. Kurbakov ◽  
V.A. Trounov ◽  
T.K. Baranova ◽  
A.P. Bulkin ◽  
R.P. Dmitriev ◽  
...  

2019 ◽  
Vol 59 (6) ◽  
pp. 065001 ◽  
Author(s):  
Marek Scholz ◽  
Anders Hjalmarsson ◽  
Leszek Hajduk ◽  
Göran Ericsson ◽  
Jerzy Kotula ◽  
...  

2006 ◽  
Vol 385-386 ◽  
pp. 1010-1012 ◽  
Author(s):  
Klaus-Dieter Liss ◽  
Brett Hunter ◽  
Mark Hagen ◽  
Terrence Noakes ◽  
Shane Kennedy

2011 ◽  
Vol 80 (Suppl.B) ◽  
pp. SB020 ◽  
Author(s):  
Shuki Torii ◽  
Masao Yonemura ◽  
Teguh Yulius Surya Panca Putra ◽  
Junrong Zhang ◽  
Ping Miao ◽  
...  

1998 ◽  
Vol 37 (Part 1, No. 6A) ◽  
pp. 3319-3326 ◽  
Author(s):  
Kenji Ohoyama ◽  
Tomonori Kanouchi ◽  
Keiji Nemoto ◽  
Masayoshi Ohashi ◽  
Tsuyoshi Kajitani ◽  
...  

2000 ◽  
Vol 276-278 ◽  
pp. 146-147 ◽  
Author(s):  
P Fischer ◽  
G Frey ◽  
M Koch ◽  
M Könnecke ◽  
V Pomjakushin ◽  
...  

2006 ◽  
Vol 39 (1) ◽  
pp. 90-100 ◽  
Author(s):  
T. Ida ◽  
H. Hibino

The asymmetry of diffraction peak profiles observed with a high-resolution synchrotron powder X-ray diffractometer has been successfully removed by a double deconvolution method. In the first step, the asymmetry caused by the axial divergence aberration of the diffractometer is removed by a whole-pattern deconvolution method based on ana prioritheoretical model for the aberration. In the second step, the residual asymmetry, the origin of which can be ascribed to the aberrations of the beamline optics, is also removed by a whole-pattern deconvolution method, based on an empirical model derived from the analysis of experimental diffraction peak profiles of a standard Si powder (NIST SRM640b). The beamline aberration has been modelled by the convolution of a pseudo-Voigt or Voigt function with an exponential distribution function. It has been found that the angular dependence of the asymmetry parameter in the exponential function is almost proportional to tanθ, which supports the idea that the residual asymmetry should be ascribed mainly to the intrinsic asymmetry in the spectroscopic distribution of the source X-ray supplied by the beamline optics of the synchrotron facility. Recently developed procedures of whole-pattern deconvolution have been improved to treat the singularity of the instrumental function in the measured angular range. Formulae for the whole-pattern deconvolution based on the Williamson–Hall-type dependence of the width parameter of the instrumental function have also been developed. The method was applied to the diffraction intensity data of a standard ZnO powder sample (NIST SRM674) measured with a high-resolution powder diffractometer on beamline BL4B2at the Photon Factory. The structure parameters of ZnO were refined from the integrated peak intensities, which were extracted by an individual profile fitting method applying symmetric profile models. The refined structure parameters coincide fairly well with those obtained from single-crystal data.


2015 ◽  
Vol 10 (06) ◽  
pp. P06010-P06010 ◽  
Author(s):  
M. Doncel ◽  
B. Cederwall ◽  
S. Martín ◽  
B. Quintana ◽  
A. Gadea ◽  
...  

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