Echidna—the new high-resolution powder diffractometer being built at OPAL

2006 ◽  
Vol 385-386 ◽  
pp. 1010-1012 ◽  
Author(s):  
Klaus-Dieter Liss ◽  
Brett Hunter ◽  
Mark Hagen ◽  
Terrence Noakes ◽  
Shane Kennedy
Keyword(s):  
High Resolution ◽  
Powder Diffractometer

Russian-French High Resolution Multi-Section Neutron Powder Diffractometer

2000 ◽  
Vol 321-324 ◽  
pp. 308-313 ◽  
Author(s):  
A.I. Kurbakov ◽  
V.A. Trounov ◽  
T.K. Baranova ◽  
A.P. Bulkin ◽  
R.P. Dmitriev ◽  
...  
Keyword(s):  
High Resolution ◽  
Powder Diffractometer ◽  
Neutron Powder Diffractometer

scholarly journals Super High Resolution Powder Diffractometer at J-PARC

2011 ◽  
Vol 80 (Suppl.B) ◽  
pp. SB020 ◽  
Author(s):  
Shuki Torii ◽  
Masao Yonemura ◽  
Teguh Yulius Surya Panca Putra ◽  
Junrong Zhang ◽  
Ping Miao ◽  
...  
Keyword(s):  
High Resolution ◽  
Powder Diffractometer

The New Neutron Powder Diffractometer with a Multi-Detector System for High-Efficiency and High-Resolution Measurements

1998 ◽  
Vol 37 (Part 1, No. 6A) ◽  
pp. 3319-3326 ◽  
Author(s):  
Kenji Ohoyama ◽  
Tomonori Kanouchi ◽  
Keiji Nemoto ◽  
Masayoshi Ohashi ◽  
Tsuyoshi Kajitani ◽  
...  
Keyword(s):  
High Resolution ◽  
High Efficiency ◽  
Detector System ◽  
Powder Diffractometer ◽  
Neutron Powder Diffractometer

High-resolution powder diffractometer HRPT for thermal neutrons at SINQ

2000 ◽  
Vol 276-278 ◽  
pp. 146-147 ◽  
Author(s):  
P Fischer ◽  
G Frey ◽  
M Koch ◽  
M Könnecke ◽  
V Pomjakushin ◽  
...  
Keyword(s):  
High Resolution ◽  
Thermal Neutrons ◽  
Powder Diffractometer

Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer

2006 ◽  
Vol 39 (1) ◽  
pp. 90-100 ◽  
Author(s):  
T. Ida ◽  
H. Hibino
Keyword(s):  
High Resolution ◽  
A Priori ◽  
Diffraction Peak ◽  
Structure Parameters ◽  
Instrumental Function ◽  
Deconvolution Method ◽  
X Ray ◽  
Powder Diffractometer ◽  
Profile Fitting ◽  
The Asymmetry

The asymmetry of diffraction peak profiles observed with a high-resolution synchrotron powder X-ray diffractometer has been successfully removed by a double deconvolution method. In the first step, the asymmetry caused by the axial divergence aberration of the diffractometer is removed by a whole-pattern deconvolution method based on ana prioritheoretical model for the aberration. In the second step, the residual asymmetry, the origin of which can be ascribed to the aberrations of the beamline optics, is also removed by a whole-pattern deconvolution method, based on an empirical model derived from the analysis of experimental diffraction peak profiles of a standard Si powder (NIST SRM640b). The beamline aberration has been modelled by the convolution of a pseudo-Voigt or Voigt function with an exponential distribution function. It has been found that the angular dependence of the asymmetry parameter in the exponential function is almost proportional to tanθ, which supports the idea that the residual asymmetry should be ascribed mainly to the intrinsic asymmetry in the spectroscopic distribution of the source X-ray supplied by the beamline optics of the synchrotron facility. Recently developed procedures of whole-pattern deconvolution have been improved to treat the singularity of the instrumental function in the measured angular range. Formulae for the whole-pattern deconvolution based on the Williamson–Hall-type dependence of the width parameter of the instrumental function have also been developed. The method was applied to the diffraction intensity data of a standard ZnO powder sample (NIST SRM674) measured with a high-resolution powder diffractometer on beamline BL4B2at the Photon Factory. The structure parameters of ZnO were refined from the integrated peak intensities, which were extracted by an individual profile fitting method applying symmetric profile models. The refined structure parameters coincide fairly well with those obtained from single-crystal data.

scholarly journals Super High Resolution Powder Diffractometer

Materia Japan ◽  
2009 ◽  
Vol 48 (7) ◽  
pp. 353-354 ◽  
Author(s):  
Takashi Kamiyama ◽  
Shuki Torii
Keyword(s):  
High Resolution ◽  
Powder Diffractometer

Management of metadata and automation for mail-in measurements with the APS 11-BM high-throughput, high-resolution synchrotron powder diffractometer

2009 ◽  
Vol 42 (6) ◽  
pp. 990-993 ◽  
Author(s):  
Brian H. Toby ◽  
Yu Huang ◽  
Don Dohan ◽  
David Carroll ◽  
Xuesong Jiao ◽  
...  
Keyword(s):  
High Resolution ◽  
High Throughput ◽  
Safety Information ◽  
Simple Manner ◽  
Web Interfaces ◽  
Project Completion ◽  
Post Process ◽  
Powder Diffractometer ◽  
Quality Check ◽  
Photon Source

A high-resolution and high-throughput synchrotron powder diffractometer has been automated for use with samples that are mailed in by Advanced Photon Source users. Implementation of a relational database with web interfaces for both outside users and beamline staff, which is integrated into the facility-wide proposal and safety system, allows all aspects of beamline management to be integrated. This system permits users to request kits for mounting samples, to provide sample safety information, to obtain their collected data and to provide usage information upon project completion in a quick and simple manner. Beamline staff use a separate interface to note receipt of samples, schedule and collect diffraction data, post-process and quality-check data, and dispose of samples. The design of the software and database are discussed in detail.

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