Investigation of frequency and voltage dependence surface states and series resistance profiles using admittance measurements in Al/p-Si with Co 3 O 4 -PVA interlayer structures
2017 ◽
Vol 515
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pp. 28-33
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2020 ◽
Vol 582
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pp. 411979
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2017 ◽
Vol 708
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pp. 464-469
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Vol 85
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pp. 5728-5736
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