Effect of film thickness on the optical constants and optical absorption properties of NiOx thin films

2010 ◽  
Vol 405 (18) ◽  
pp. 3875-3878 ◽  
Author(s):  
Ying Zhou ◽  
Yongyou Geng ◽  
Donghong Gu ◽  
Weibing Gu ◽  
Zhi Jiang
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Film Thickness ◽  
Optical Constants ◽  
Absorption Properties

Ellipsometric Determination of the Spectra of Adsorbed Molecules

1971 ◽  
Vol 49 (7) ◽  
pp. 1115-1132 ◽  
Author(s):  
M. J. Dignam ◽  
B. Rao ◽  
M. Moskovits ◽  
R. W. Stobie
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Optical Constants ◽  
Order Term ◽  
Second Order ◽  
Lower Sensitivity ◽  
Model Calculations ◽  
The Media ◽  
Reflecting Surfaces ◽  
Optical Behavior

This paper presents a detailed analysis of the application of ellipsometry to obtaining the optical spectra (principally infrared (i.r.)) of molecules adsorbed on reflecting surfaces. Both external and total internal reflections are considered and the conditions for optimum sensitivity examined. A new empirical quantity, the relative complex optical density, is defined which exhibits thin film properties well, particularly in the case of multiple reflection measurements. An explicit expression is derived for this density function (relating it to the optical constants of the media and other system parameters), which is both reasonably simple and correct to second order terms in the film thickness. It is shown that for thin films, no higher order terms need be included, but that in general the second order term must be retained. Various limiting cases are examined to gain insight into the optical behavior of thin films, and to the same end, model calculations performed for CCl4 physically adsorbed on Ag, Ni, Sb, and Ge. In relation to conventional reflection spectroscopy, ellipsometric spectroscopy is shown to have three major advantages: (1) in general, higher sensitivity to adsorbate properties; (2) very much lower sensitivity to absorption of radiation by the adjacent gas phase; (3) more information, permitting the optical constants and film thickness to be determined. Finally, the practicability of the technique is demonstrated by presenting preliminary results for CH3OH reversibly adsorbed on Ag, showing clearly the C—H stretching bands.

Microstructure and optical absorption properties of Au-dispersed CoO thin films

2011 ◽  
Vol 509 (19) ◽  
pp. 5731-5735 ◽  
Author(s):  
Shi-Jing Wang ◽  
Bo-Ping Zhang ◽  
Li-Ping Yan ◽  
Wei Deng
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Properties

Optical Characterization of C60 Organic Semiconductor and Bilayers

1997 ◽  
Vol 488 ◽  
Author(s):  
J. P. Rainho ◽  
L. Santos ◽  
A. A. Kharlamov
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Optical Absorption ◽  
Film Thickness ◽  
Organic Semiconductor ◽  
Optical Characterization ◽  
Organic Dye ◽  
Zinc Phthalocyanine ◽  
Micro Raman Spectroscopy

AbstractPreparation and characterization either by optical absorption, photoluminescence and micro-Raman spectroscopy of individual components as well as bilayers consisting of organic dye semiconductor Zinc Phthalocyanine (ZnPc) and fullerene, C60, thin films are reported. The layers and structures were deposited in vacuum and some fullerene films were also prepared by casting the C60 solution in benzene. The optical absorption and photoluminescence dependencies on film thickness in bilayers C60/ZnPc were observed and may be discussed in a context of interface induced simmetry reduction of C60 molecules.

Plasmonic and Nonlinear Optical Absorption Properties of Ag:ZrO2 Nanocomposite Thin Films

Plasmonics ◽  
2013 ◽  
Vol 9 (1) ◽  
pp. 129-136 ◽  
Author(s):  
Manish Kumar ◽  
C. S. Suchand Sandeep ◽  
G. Kumar ◽  
Y. K. Mishra ◽  
R. Philip ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Nonlinear Optical ◽  
Absorption Properties ◽  
Nonlinear Optical Absorption ◽  
Nanocomposite Thin Films

High Optical Absorption of Indium Sulfide Nanorod Arrays Formed by Glancing Angle Deposition

2009 ◽  
Vol 1165 ◽  
Author(s):  
Mehmet Cansizoglu ◽  
Robert Engelken ◽  
Hye-Won Seo ◽  
Tansel Karabacak
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Optical Sensors ◽  
High Efficiency ◽  
Glancing Angle Deposition ◽  
Indium Sulfide ◽  
Nanorod Arrays ◽  
Absorption Properties ◽  
Glancing Angle ◽  
Angle Deposition

AbstractIndium (III) sulfide has recently attracted much attention due to its potential in optical sensors as a photoconducting material and in photovoltaic applications as a wide direct bandgap material. On the other hand, optical absorption properties are key parameters in developing highly photosensitive photodetectors and high efficiency solar cells. We show that indium sulfide nanorod arrays produced by glancing angle deposition techniques have superior absorption and low reflectance properties compared to conventional flat thin film counterparts. We observed an optical absorption value of approximately 96% for nanorods, in contrast to 80% for conventional amorphous-to-polycrystalline thin films of indium sulfide. A photoconductivity response was also observed in the nanorod samples, whereas no measurable photoresponse was detected in conventional thin films. We give a preliminary description of the enhanced light absorption properties of the nanorods by using Shirley-George Model that predicts enhanced diffuse scattering and reduced reflection of light due the rough morphology.

OPTICAL ABSORPTION IN AMORPHOUS THIN FILMS OF SnO2 DEPOSITED BY THERMAL EVAPORATION

2007 ◽  
Vol 21 (12) ◽  
pp. 2017-2032 ◽  
Author(s):  
M. ANWAR ◽  
S. A. SIDDIQI ◽  
I. M. GHAURI
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Film Thickness ◽  
Substrate Temperature ◽  
Band Gap ◽  
Optical Band Gap ◽  
Fundamental Absorption Edge ◽  
Outward Diffusion ◽  
Optical Energy ◽  
Amorphous Thin Films

The fundamental absorption edge of SnO 2 amorphous thin films has been investigated. It has been observed that the optical energy gap decreases with the increase in film thickness, substrate temperature and post deposition annealing. The results are analysed by assuming optical absorption by non-direct transition. The decrease in optical band gap with increase in film thickness may be interpreted in terms of the incorporation of oxygen vacancies in the SnO 2 lattice. The decrease in optical energy due to the increase in substrate temperature may be ascribed to the release of trapped electrons by thermal energy or by the outward diffusion of the oxygen-ion vacancies, which are quite mobile even at low temperatures. The decrease in optical band gap due to annealing may be due to the formation of tin species of lower oxidation state.

Microstructure and optical absorption properties of Au/NiO thin films

2011 ◽  
Vol 18 (1) ◽  
pp. 115-120 ◽  
Author(s):  
Cui-hua Zhao ◽  
Bo-ping Zhang ◽  
Shi-jing Wang ◽  
Peng-peng Shang ◽  
Can Chen
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Properties
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