Neutron diffraction studies of molecular liquids using the new detector system of the PSD diffractometer at the Budapest Research Reactor

2004 ◽  
Vol 350 (1-3) ◽  
pp. E865-E867 ◽  
Author(s):  
László Temleitner ◽  
György Mészáros ◽  
László Pusztai ◽  
Erzsébet Sváb
Keyword(s):  
Neutron Diffraction ◽  
Research Reactor ◽  
Detector System ◽  
Molecular Liquids

Kowari – OPAL’s Residual-Stress Diffractometer and its Application to Materials Science and Engineering

2008 ◽  
Vol 41-42 ◽  
pp. 439-444 ◽  
Author(s):  
Oliver Kirstein ◽  
Vladimir Luzin ◽  
Alain Brule ◽  
Hien Nguyen ◽  
David Tawfik
Keyword(s):  
Residual Stress ◽  
Neutron Diffraction ◽  
Residual Stresses ◽  
Research Reactor ◽  
Materials Science ◽  
Science Research ◽  
Science And Engineering ◽  
Material Science Research ◽  
Engineering Problems ◽  
Materials Science And Engineering

The Australian Nuclear Science and Technology Organisation (ANSTO) has recently started commissioning the new Australian Research Reactor OPAL that has replaced the old HIFAR reactor in January 2007. At the first stage, the new reactor will provide neutrons to several neutron scattering instruments. Among them is the residual stress diffractometer Kowari that was designed to study engineering problems related to residual stresses as well as allow material science research using neutron diffraction. We give an update on the progress of the instrument’s installation and commissioning and present an example to illustrate how neutron diffraction can be used to obtain information about residual stresses in a flash butt welded plate.

NEUTRON DIFFRACTION AND RMC MODELLING: COMPLEMENTARY TECHNIQUES FOR THE DETERMINATION OF DISORDERED STRUCTURES

1993 ◽  
Vol 07 (16n17) ◽  
pp. 2965-2980 ◽  
Author(s):  
R.L. McGREEVY
Keyword(s):  
Neutron Diffraction ◽  
Metallic Glasses ◽  
Disordered Materials ◽  
Molecular Liquids ◽  
X Ray ◽  
Magnetic Structures ◽  
Future Developments ◽  
Disordered Structures ◽  
Complementary Techniques

The use of neutron diffraction and RMC modelling in the determination of the structures of disordered materials is described. The principle of the method is outlined and then illustrated by examples including monatomic and binary liquids, molecular liquids, solutions and metallic glasses. The application to the determination of magnetic structures in disordered materials is also shown. Finally the extension to enable the combination of neutron and X-ray data, and possible future developments, are discussed.

New determination method of the neutron diffraction system resolution at the Algerian Es-Salam research reactor

2011 ◽  
Vol 291 (3) ◽  
pp. 665-672 ◽  
Author(s):  
M. Hachouf ◽  
M. Abbaci ◽  
N. Bensemma ◽  
N. Hachouf ◽  
M. Touiza ◽  
...  
Keyword(s):  
Neutron Diffraction ◽  
Research Reactor ◽  
Determination Method

EPSILON-MDS – A Neutron Time-of-Flight Diffractometer for Strain Measurements

2005 ◽  
Vol 105 ◽  
pp. 67-70 ◽  
Author(s):  
Kurt Walther ◽  
Alexander Frischbutter ◽  
Christian Scheffzük ◽  
M. Korobshenko ◽  
F. Levshanovski ◽  
...  
Keyword(s):  
Neutron Diffraction ◽  
Data Acquisition ◽  
Spectral Resolution ◽  
Time Of Flight ◽  
Detector System ◽  
Geological Samples ◽  
Strain Measurements ◽  
Efficient Data ◽  
Neutron Time ◽  
Time Of Flight Method

This paper describes the modernized diffractometer EPSILON-MDS for strain measurements of geological samples by means of neutron diffraction with the time-of-flight method. The diffractometer is characterized by a long flight path in order to get a good spectral resolution and by a multi-detector system for efficient data acquisition.

Imaging and diffraction modes in Scanning Transmission Electron Microscopy

1986 ◽  
Vol 44 ◽  
pp. 684-687
Author(s):  
J. M. Cowley ◽  
R. Glaisher ◽  
J. A. Lin ◽  
H.-J. Ou
Keyword(s):  
Scanning Transmission Electron Microscopy ◽  
High Efficiency ◽  
Fiber Optic ◽  
Image Intensifier ◽  
Detector System ◽  
Detector Plane ◽  
Secondary Electrons ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Special Detector

Some of the most important applications of STEM depend on the variety of imaging and diffraction made possible by the versatility of the detector system and the serial nature, of the image acquisition. A special detector system, previously described, has been added to our STEM instrument to allow us to take full advantage of this versatility. In this, the diffraction pattern in the detector plane may be formed on either of two phosphor screens, one with P47 (very fast) phosphor and the other with P20 (high efficiency) phosphor. The light from the phosphor is conveyed through a fiber-optic rod to an image intensifier and TV system and may be photographed, recorded on videotape, or stored digitally on a frame store. The P47 screen has a hole through it to allow electrons to enter a Gatan EELS spectrometer. Recently a modified SEM detector has been added so that high resolution (10Å) imaging with secondary electrons may be used in conjunction with other modes.

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