Unusual properties of the dominant acceptor in freestanding GaN

2003 ◽  
Vol 340-342 ◽  
pp. 448-451 ◽  
Author(s):  
M.A. Reshchikov ◽  
S.S. Park ◽  
K.Y. Lee ◽  
H. Morkoç
Keyword(s):  
1997 ◽  
Vol 27 (7) ◽  
pp. 1685-1690 ◽  
Author(s):  
Eckhard Lammert ◽  
Stefan Stevanović ◽  
Josef Brunner ◽  
Hans-Georg Rammensee ◽  
Hansjörg Schild

2015 ◽  
Vol 43 (3) ◽  
pp. 427-445 ◽  
Author(s):  
Z. Starck ◽  
L. Ubysz

Sink activity in young sunflower and bean plants was determined mainly by their growth rate. The organ with higher RGR (stem in sunflower and apical part with expanded trifoliate leaf- in bean plant) was the dominant acceptor even in conditions of limited supply of assimilates.Specific activity of root - donor of phosphorus, depends on the roofs metabolic and physiological activity only in the case, when supply of P to the aerial parts is not a factor limiting photosynthesis. If the activity of the whole root system is relatively low (like in preshaded series of sunflower) the photosynthetic compensation observed in plants replaced into better conditions coincides with compensation of P-absorption (both calculated per g of dry matter). It may explain the existence of a functional balance between shoot and root activity in the case of a changed proportion between their sizes.


Author(s):  
Nicolò Zagni ◽  
Marcello Cioni ◽  
Ferdinando Iucolano ◽  
Maurizio Moschetti ◽  
Giovanni Verzellesi ◽  
...  

Abstract In this paper, we investigate the influence of Poole-Frenkel Effect (PFE) on the dynamic R ON transients in C-doped p-GaN HEMTs. To this aim, we perform a characterization of the dynamic R ON transients acquired during OFF-state stress (i.e., V GS,STR = 0 V < V T, V DS,STR = 25–125 V and we interpret the results with the aid of numerical simulations. We find that dynamic R ON transients at room temperature accelerate with V DS,STR 1/2, which is signature of PFE, as further confirmed by the simultaneous decrease of the activation energy (E A) extracted from the Arrhenius plot of the dynamic R ON transients at V DS,STR = 50 V and T = 30–110 °C. Results obtained by means of calibrated numerical simulations reproduce the exponential dependence of transients time constants (τ) on V DS,STR 1/2 and consequent E A reduction only when including PFE enhancement of hole emission from dominant acceptor traps in the buffer related to C doping. This result is consistent with the model that considers hole emission from acceptor traps (rather than electron capture) as the mechanism underlying dynamic R ON increase during OFF-state stress.


2002 ◽  
Vol 81 (26) ◽  
pp. 4970-4972 ◽  
Author(s):  
M. A. Reshchikov ◽  
H. Morkoç ◽  
S. S. Park ◽  
K. Y. Lee

2004 ◽  
Vol 829 ◽  
Author(s):  
D. C. Look ◽  
B. Claflin

ABSTRACTIn recent years, ZnO has been proposed for new electronic and optoelectronic devices, such as transparent transistors and UV light-emitting diodes (LEDs). The LED application will require both n-type and p-type ZnO, but the latter is difficult to produce, and progress in this area will require a detailed knowledge of the various impurities and defects that affect the electrical and optical properties. The dominant donors in as-grown ZnO are usually thought to be interstitial H and substitutional AlZn, with activation energies of about 40 and 65 meV, respectively. However, interstitial Zn and its associated complexes may also contribute free electrons. The dominant acceptor, at least in vapor-phase-grown material, is the Zn vacancy; however, substitutional NO is also present, although sometimes passivated by H. To produce p-type ZnO, it is necessary to dope with acceptor-type impurities, and some success has been achieved with N, P, As, and Sb. However, only N has been proven to have simple substitutional character (NO), and more complicated acceptor structures, such as AsZn-2VZn, have been proposed for some of the other group V elements. Both homostructural and heterostructural UV LEDs have been fabricated, although not of high luminescent power so far. The main objective of this paper is to review the Hall-effect and photoluminescence results on n-type and p-type ZnO.


2003 ◽  
Vol 91 (20) ◽  
Author(s):  
F. Tuomisto ◽  
V. Ranki ◽  
K. Saarinen ◽  
D C. Look
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document