scholarly journals Study of local structure at crystalline rubrene grain boundaries via scanning transmission X-ray microscopy

2019 ◽  
Vol 74 ◽  
pp. 315-320
Author(s):  
Alexandre L. Foggiatto ◽  
Yasuo Takeichi ◽  
Kanta Ono ◽  
Hiroki Suga ◽  
Yoshio Takahashi ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
Local Structure ◽  
X Ray ◽  
Scanning Transmission

A Study of Grain Boundaries in High TC Superconducting Yba2Cu3O7-x Thin Films Using High Resolution Analytical Stem

1989 ◽  
Vol 169 ◽  
Author(s):  
D. H. Shin ◽  
J. Silcox ◽  
S. E. Russek ◽  
D. K. Lathrop ◽  
R. A. Buhrman
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Grain Boundaries ◽  
Scanning Transmission Electron Microscope ◽  
Atomic Resolution ◽  
High Tc ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Edx Microanalysis

AbstractGrain boundaries in thin films of high Tc YBa2Cu3O7-x superconductors have been investigated with high resolution scanning transmission electron microscope (STEM) imaging and nanoprobe energy dispersive x-ray (EDX) analysis. Atomic resolution images indicate that the grain boundaries are mostly clean, i.e., free of a boundary layer of different phase or of segregation, and are often coherent. EDX microanalysis with a 10 Å spatial resolution also indicates no composition deviation at the grain boundaries.

Local structure of titania decorated double-walled carbon nanotube characterized by scanning transmission X-ray microscopy

2012 ◽  
Vol 136 (17) ◽  
pp. 174701 ◽  
Author(s):  
Hongbo Zhang ◽  
Jian Wang ◽  
Xiulian Pan ◽  
Yongfeng Hu ◽  
Xinhe Bao
Keyword(s):  
Carbon Nanotube ◽  
Local Structure ◽  
X Ray ◽  
Scanning Transmission

Distribution of the Precipitates on the Grain Boundaries in Fe-3%Si Steel during Secondary Recrystallization Annealing

2007 ◽  
Vol 558-559 ◽  
pp. 1453-1457 ◽  
Author(s):  
Jung Ryoul Yim ◽  
Ah Ri Min ◽  
Jong Tae Park ◽  
Young Chang Joo
Keyword(s):  
Grain Boundaries ◽  
Scanning Transmission Electron Microscopy ◽  
Energy Dispersive Spectrometer ◽  
Secondary Recrystallization ◽  
Recrystallization Annealing ◽  
High Angle ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Multi Phase

The distribution of the precipitates on the grain boundaries in Fe-3%Si steel during secondary recrystallization annealing were studied using high-angle annular dark filed (HAADF) scanning transmission electron microscopy (STEM). Because HAADF image can show both grain boundaries and precipitates clearly, the change of precipitate distribution on grain boundaries can be quantitatively analyzed. It was observed that the total area of the precipitates on grain boundaries increased in the order of non-annealed, 600°C, and 900°C sample and the total area of precipitates on grain boundaries in the 1000 °C sample was much lower than that in the 900 °C sample. The compositions of the precipitates were also analyzed using X-ray energy-dispersive spectrometer (XEDS). The most precipitates were multi-phase ones, mainly composed of AlN and MnS. Our analysis results suggest that such a precipitate behavior is responsible for the abnormal grain growth of Fe-3%Si steel occurring under the temperature above 900 °C.

A Stem Study of P and Ge Segregation to Grain Boundaries in Si1-xGex Thin Films

1999 ◽  
Vol 557 ◽  
Author(s):  
W. Qin ◽  
D. G. Ast ◽  
T. I. Kamins
Keyword(s):  
Grain Boundaries ◽  
Secondary Ion Mass Spectrometry ◽  
Chemical Vapor ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Equilibrium Process ◽  
Sims Analysis ◽  
Secondary Ion ◽  
Edx Microanalysis

AbstractThe segregation of phosphorus to grain boundaries in phosphorus implanted Si0.87Ge0.13 films, deposited by chemical vapor deposition (CVD), was directly observed by scanning transmission electron microscopy (STEM) with energy dispersive x-ray (EDX) microanalysis. The segregation was determined to be a thermal equilibrium process by measuring and comparing the average phosphorus concentrations at the grain boundaries in Si0.87Ge0.13 films subjected to 700, 750 or 800°C annealing, following the implantation and 1000°C annealing processes. The measured segregation energy was 0.28 eV/atom. No Ge segregation was found at grain boundaries in phosphorus implanted Si0.87Ge0.13 films by STEM x-ray microanalysis. Neither was evidence shown by STEM microanalysis that Ge segregated to grain boundaries in intrinsic Si1-xGex films with x = 0.02, 0.13 and 0.31. Secondary ion mass spectrometry (SIMS) analysis showed that these intrinsic Si1-xGex films contained 1019 to 4 × 1019/cm-3H, depending on the deposition temperature.

Microanalysis of precipitates in a ferritic steel

1978 ◽  
Vol 36 (1) ◽  
pp. 618-619
Author(s):  
J.M. Titchmarsh
Keyword(s):  
Ferritic Steel ◽  
Particle Identification ◽  
Energy Dispersive ◽  
Objective Lens ◽  
Ferritic Steels ◽  
Replica Technique ◽  
X Ray ◽  
Large Numbers ◽  
Scanning Transmission ◽  
Made In

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.

High-resolution x-ray analysis of dislocation networks nn tilt boundaries

1988 ◽  
Vol 46 ◽  
pp. 612-613
Author(s):  
J. R. Michael ◽  
C. H. Lin ◽  
S. L. Sass
Keyword(s):  
Grain Boundaries ◽  
Analytical Electron Microscopy ◽  
Solute Segregation ◽  
X Ray ◽  
Periodic Arrays ◽  
Analytical Electron ◽  
Primary Dislocation ◽  
Tilt Boundaries ◽  
Polycrystalline Solids ◽  
Twist Boundaries

The segregation of solute atoms to grain boundaries in polycrystalline solids can be responsible for embrittlement of the grain boundaries. Although Auger electron spectroscopy (AES) and analytical electron microscopy (AEM) have verified the occurrence of solute segregation to grain boundaries, there has been little experimental evidence concerning the distribution of the solute within the plane of the interface. Sickafus and Sass showed that Au segregation causes a change in the primary dislocation structure of small angle [001] twist boundaries in Fe. The bicrystal specimens used in their work, which contain periodic arrays of dislocations to which Au is segregated, provide an excellent opportunity to study the distribution of Au within the boundary by AEM.The thin film Fe-0.8 at% Au bicrystals (composition determined by Rutherford backscattering spectroscopy), ∼60 nm thick, containing [001] twist boundaries were prepared as described previously. The bicrystals were analyzed in a Vacuum Generators HB-501 AEM with a field emission electron source and a Link Analytical windowless x-ray detector.

High-resolution x-ray imaging of small copper-rich precipitates in steels

1988 ◽  
Vol 46 ◽  
pp. 528-529
Author(s):  
J. R. Michael ◽  
K. A. Taylor
Keyword(s):  
Electron Microscopy ◽  
Thermomechanical Processing ◽  
Atom Probe ◽  
Ferrite Matrix ◽  
Scanning Transmission Electron Microscope ◽  
Probe Field ◽  
X Ray ◽  
Subsequent Transformation ◽  
Transmission Electron ◽  
Scanning Transmission

Although copper is considered an incidental or trace element in many commercial steels, some grades contain up to 1-2 wt.% Cu for precipitation strengthening. Previous electron microscopy and atom-probe/field-ion microscopy (AP/FIM) studies indicate that the precipitation of copper from ferrite proceeds with the formation of Cu-rich bcc zones and the subsequent transformation of these zones to fcc copper particles. However, the similarity between the atomic scattering amplitudes for iron and copper and the small misfit between between Cu-rich particles and the ferrite matrix preclude the detection of small (<5 nm) Cu-rich particles by conventional transmission electron microscopy; such particles have been imaged directly only by FIM. Here results are presented whereby the Cu Kα x-ray signal was used in a dedicated scanning transmission electron microscope (STEM) to image small Cu-rich particles in a steel. The capability to detect these small particles is expected to be helpful in understanding the behavior of copper in steels during thermomechanical processing and heat treatment.

Energy Dispersive X-Ray Measurements of thin Metal Foils

1976 ◽  
Vol 34 ◽  
pp. 426-427
Author(s):  
J. Bentley ◽  
E. A. Kenik
Keyword(s):  
Materials Science ◽  
Energy Dispersive Spectrometer ◽  
Thin Foil ◽  
Thin Metal ◽  
Energy Dispersive ◽  
Thin Specimen ◽  
X Ray ◽  
Metal Foils ◽  
Small Probe ◽  
Scanning Transmission

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.

Techniques for cryoultramicrotomy of propane jet frozen biological samples

1986 ◽  
Vol 44 ◽  
pp. 260-261
Author(s):  
B. Craig ◽  
L. Hawkey ◽  
A. LeFurgey
Keyword(s):  
Freeze Fracture ◽  
Freeze Substitution ◽  
Heart Cells ◽  
Crystal Formation ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Chick Heart ◽  
Embryonic Chick Heart ◽  
A New Technique

Ultra-rapid freezing followed by cryoultramicrotomy is essential for the preservation of diffusible elements in situ within cells prior to scanning transmission electron microscopy and quantitative energy dispersive x-ray microanalysis. For cells or tissue fragments in suspension and for monolayer cell cultures, propane jet freezing provides cooling rates greater than 30,000°C/sec with regions up to 40μm in thickness free of significant ice crystal formation. While this method of freezing has frequently been applied prior to freeze fracture or freeze substitution, it has not been widely utilized prior to cryoultramicrotomy and subsequent x-ray microanalytical studies. This report describes methods devised in our laboratory for cryosectioning of propane jet frozen kidney proximal tubule suspensions and cultured embryonic chick heart cells, in particular a new technique for mounting frozen suspension specimens for sectioning. The techniques utilize the same specimen supports and sample holders as those used for freeze fracture and freeze substitution and should be generally applicable to any cell suspension or culture preparation.

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