Effect of Si nanoparticles embedded in SiOx on optical properties of the films studied by spectroscopic ellipsometry and photoluminescence spectroscopy

2008 ◽  
Vol 30 (7) ◽  
pp. 1115-1120 ◽  
Author(s):  
A. Szekeres ◽  
T. Nikolova ◽  
A. Paneva ◽  
I. Lisovskyy ◽  
P.E. Shepeliavyi ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Photoluminescence Spectroscopy ◽  
Si Nanoparticles

scholarly journals Determination of the optical properties and size dispersion of Si nanoparticles within a dielectric matrix by spectroscopic ellipsometry

2014 ◽  
Vol 116 (10) ◽  
pp. 103520 ◽  
Author(s):  
A.-S. Keita ◽  
A. En Naciri ◽  
Y. Battie ◽  
F. Delachat ◽  
M. Carrada ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Dielectric Matrix ◽  
Si Nanoparticles ◽  
Size Dispersion

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

Optical properties of Sub-30 nm-thick ZnS films studied by spectroscopic ellipsometry

2022 ◽  
Vol 142 ◽  
pp. 106454
Author(s):  
Cheng Wang ◽  
Chong Ma ◽  
Junbo He ◽  
Weiming Liu ◽  
Xudan Zhu ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Zns Films

Optical properties of amorphous hydrogenated carbon films: A spectroscopic ellipsometry study

1987 ◽  
Vol 2 (5) ◽  
pp. 645-647 ◽  
Author(s):  
Shuhan Lin ◽  
Shuguang Chen
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Carbon Films ◽  
Index Of Refraction ◽  
The Real ◽  
Complex Index ◽  
Tentative Explanation ◽  
Amorphous Hydrogenated Carbon ◽  
Ellipsometry Data ◽  
Complex Index Of Refraction

Optical properties of plasma-deposited amorphous hydrogenated carbon films were studied by spectroscopic ellipsometry. From the ellipsometry data, the real and imaginary parts, n and k, of the complex index of refraction of the film have been deduced for photon energies between 2.0 and 4.0 eV for as-grown as well as for thermally annealed films. Here n and k showed considerable variation with subsequent annealing, even under 400°C. A tentative explanation of the results is proposed.

scholarly journals Optical Properties and van der Waals-London Dispersion Interactions in Inorganic and Biomolecular Assemblies

2014 ◽  
Vol 1619 ◽  
Author(s):  
Daniel M. Dryden ◽  
Yingfang Ma ◽  
Jacob Schimelman ◽  
Diana Acosta ◽  
Lijia Liu ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Density Functional ◽  
Type I Collagen ◽  
Strong Dependence ◽  
Van Der Waals ◽  
Fundamental Absorption Edge ◽  
Type I ◽  
Dispersion Interactions ◽  
London Dispersion

ABSTRACTThe optical properties and electronic structure of AlPO4, SiO2, Type I collagen, and DNA were examined to gain insight into the van der Waals-London dispersion behavior of these materials. Interband optical properties of AlPO4 and SiO2 were derived from vacuum ultraviolet spectroscopy and spectroscopic ellipsometry, and showed a strong dependence on the crystals’ constituent tetrahedral units, with strong implications for the role of phosphate groups in biological materials. The UV-Vis decadic molar absorption of four DNA oligonucleotides was measured, and showed a strong dependence on composition and stacking sequence. A film of Type I collagen was studied using spectroscopic ellipsometry, and showed a characteristic shoulder in the fundamental absorption edge at 6.05 eV. Ab initio calculations based on density functional theory corroborated the experimental results and provided further insights into the electronic structures, interband transitions and vdW-Ld interaction potentials for these materials.

Effects of Cooling Rate on Optical Properties of Mn1.56Co0.96Ni0.48O4Ceramics by Spectroscopic Ellipsometry

2016 ◽  
Vol 492 (1) ◽  
pp. 159-165
Author(s):  
Chao Ma ◽  
Jin Bao Xu ◽  
Wei Ren ◽  
Lei Wang ◽  
Liang Bian ◽  
...  
Keyword(s):  
Optical Properties ◽  
Cooling Rate ◽  
Spectroscopic Ellipsometry
Sign in / Sign up

Export Citation Format

Share Document