An improved dispersion law of thin metal film and application to the study of surface plasmon resonance phenomenon

2014 ◽  
Vol 329 ◽  
pp. 180-183 ◽  
Author(s):  
Zhitao Yang ◽  
Dan Gu ◽  
Yachen Gao
Keyword(s):  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Metal Film ◽  
Thin Metal Film ◽  
Thin Metal ◽  
Resonance Phenomenon ◽  
Dispersion Law

scholarly journals Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film

Sensors ◽  
2018 ◽  
Vol 18 (11) ◽  
pp. 3693 ◽  
Author(s):  
Radek Chlebus ◽  
Jakub Chylek ◽  
Dalibor Ciprian ◽  
Petr Hlubina
Keyword(s):  
Surface Plasmon Resonance ◽  
Dielectric Function ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Metal Film ◽  
Gold Film ◽  
Resonance Wavelength ◽  
Thin Metal Film ◽  
Thin Metal ◽  
Kretschmann Configuration

A spectral method based on surface plasmon resonance (SPR) in air is used to measure the dielectric function of a thin metal film. The method utilizes the spectral dependence of the ratio of the reflectances of p- and s-polarized waves measured in the Kretschmann configuration at different angles of incidence. By processing these dependences in the vicinity of a dip, or equivalently near the resonance wavelength, and using the dispersion characteristics of a metal film according to a proposed physical model, the real and imaginary parts of the dielectric function of the metal can be determined. The corresponding dielectric function of the metal is obtained by a least squares method for such a thickness minimizing the difference between the measured and theoretical dependence of the resonance wavelength on the the angle of incidence. The feasibility of the method is demonstrated in measuring the dielectric function of a gold film of an SPR structure comprising an SF10 glass prism and a gold coated SF10 slide with an adhesion film of chromium. The dielectric function according to the Drude–Lorentz model with two additional Lorentzian terms was determined in a wavelength range from 534 to 908 nm, and the results show that the gold film is composed of homogenous and rough layers with thicknesses 42.8 nm and 2.0 nm, respectively. This method is particularly useful in measuring the thickness and dielectric function of a thin metal film of SPR structures, directly in the Kretschmann configuration.

Influence of surface roughness on surface plasmon resonance phenomenon of gold film

2016 ◽  
Vol 14 (4) ◽  
pp. 042401-42403 ◽  
Author(s):  
Zhitao Yang Zhitao Yang ◽  
Changjian Liu Changjian Liu ◽  
Yachen Gao Yachen Gao ◽  
Jiyu Wang Jiyu Wang ◽  
and Wenlong Yang and Wenlong Yang
Keyword(s):  
Surface Roughness ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Gold Film ◽  
Resonance Phenomenon

scholarly journals Surface plasmon resonance sensing properties of a 3D nanostructure consisting of aligned nanohole and nanocone arrays

The Analyst ◽  
2014 ◽  
Vol 139 (8) ◽  
pp. 1876-1882 ◽  
Author(s):  
Mohamadreza Najiminaini ◽  
Erden Ertorer ◽  
Bozena Kaminska ◽  
Silvia Mittler ◽  
Jeffrey J. L. Carson
Keyword(s):  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Metal Film ◽  
Molecular Surface ◽  
Sensing Properties ◽  
3D Nanostructure

Molecular surface plasmon resonance (SPR) sensing is one of the most common applications of an array of periodic nanoholes in a metal film.

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