The Model Analysis of a Complex Tuning Fork Probe and Its Application in Bimodal Atomic Force Microscopy

Zhichao Wu; Tong Guo; Ran Tao; Linyan Xu; Jinping Chen; Xing Fu; Xiaotang Hu

doi:10.3390/app7020121

The Model Analysis of a Complex Tuning Fork Probe and Its Application in Bimodal Atomic Force Microscopy

Applied Sciences ◽

10.3390/app7020121 ◽

2017 ◽

Vol 7 (2) ◽

pp. 121

Author(s):

Zhichao Wu ◽

Tong Guo ◽

Ran Tao ◽

Linyan Xu ◽

Jinping Chen ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Model Analysis ◽

Force Microscopy ◽

Atomic Force

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Tip-Substrate Shear Interaction in Quartz Tuning Fork-Based Atomic Force Microscopy in Air

New Physics Sae Mulli ◽

10.3938/npsm.71.439 ◽

2021 ◽

Vol 71 (5) ◽

pp. 439-445

Author(s):

Hyoju CHOE ◽

Dongwon KIM ◽

Manhee LEE* ◽

Myungchul CHOI

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Microscopy ◽

Atomic Force

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High-resolution imaging of C60molecules using tuning-fork-based non-contact atomic force microscopy

Journal of Physics Condensed Matter ◽

10.1088/0953-8984/24/8/084005 ◽

2012 ◽

Vol 24 (8) ◽

pp. 084005 ◽

Cited By ~ 21

Author(s):

R Pawlak ◽

S Kawai ◽

S Fremy ◽

T Glatzel ◽

E Meyer

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Tuning Fork ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1539066 ◽

2003 ◽

Vol 21 (1) ◽

pp. 323 ◽

Cited By ~ 9

Author(s):

S. Rozhok ◽

S. Jung ◽

V. Chandrasekhar ◽

Xiwei Lin ◽

Vinayak P. Dravid

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Force Microscopy ◽

Atomic Force

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Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Applied Physics Letters ◽

10.1063/1.126067 ◽

2000 ◽

Vol 76 (11) ◽

pp. 1470-1472 ◽

Cited By ~ 381

Author(s):

Franz J. Giessibl

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Atomic Resolution ◽

Force Microscopy ◽

Atomic Force

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Structural Analysis of Ionic-liquid/Organic-monolayer Interface by Phase Modulation Atomic Force Microscopy Utilizing a Quartz Tuning Fork Sensor

Electrochemistry ◽

10.5796/electrochemistry.82.380 ◽

2014 ◽

Vol 82 (5) ◽

pp. 380-384 ◽

Cited By ~ 8

Author(s):

Takashi ICHII ◽

Masahiro NEGAMI ◽

Motohiko FUJIMURA ◽

Kuniaki MURASE ◽

Hiroyuki SUGIMURA

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Structural Analysis ◽

Phase Modulation ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Microscopy ◽

Organic Monolayer ◽

Atomic Force

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Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2010.11.032 ◽

2011 ◽

Vol 111 (3) ◽

pp. 186-190 ◽

Cited By ~ 24

Author(s):

A. Castellanos-Gomez ◽

N. Agraït ◽

G. Rubio-Bollinger

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensors ◽

Force Microscopy ◽

Atomic Force ◽

Mechanical Dissipation

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Tapping and shear-mode atomic force microscopy using a quartz tuning fork with high quality factor

10.1117/12.836902 ◽

2008 ◽

Author(s):

Vo Thanh Tung ◽

Sergey A. Chizhik ◽

V. V. Chikunov ◽

Tran Xuan Hoai

Keyword(s):

Atomic Force Microscopy ◽

Quality Factor ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

High Quality Factor ◽

Shear Mode ◽

High Quality ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Angled long tip to tuning fork probes for atomic force microscopy in various environments

Review of Scientific Instruments ◽

10.1063/1.3569765 ◽

2011 ◽

Vol 82 (4) ◽

pp. 043701 ◽

Cited By ~ 15

Author(s):

Seiji Higuchi ◽

Hiromi Kuramochi ◽

Osamu Kubo ◽

Shintaro Masuda ◽

Yoshitaka Shingaya ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Force Microscopy ◽

Atomic Force

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High quality-factor quartz tuning fork glass probe used in tapping mode atomic force microscopy for surface profile measurement

Measurement Science and Technology ◽

10.1088/1361-6501/aab998 ◽

2018 ◽

Vol 29 (6) ◽

pp. 065014 ◽

Cited By ~ 2

Author(s):

Yuan-Liu Chen ◽

Yanhao Xu ◽

Yuki Shimizu ◽

Hiraku Matsukuma ◽

Wei Gao

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Surface Profile ◽

Quartz Tuning Fork ◽

Profile Measurement ◽

High Quality ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy ◽

Surface Profile Measurement

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Self-sensing and self-actuating probe based on quartz tuning fork combined with microfabricated cantilever for dynamic mode atomic force microscopy

Applied Surface Science ◽

10.1016/s0169-4332(02)01471-x ◽

2003 ◽

Vol 210 (1-2) ◽

pp. 18-21 ◽

Cited By ~ 18

Author(s):

T Akiyama ◽

U Staufer ◽

N.F de Rooij

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Dynamic Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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