Contrast enhancement on crystalline silicon in polarized reflection mode tip-enhanced Raman spectroscopy

2007 ◽  
Vol 274 (1) ◽  
pp. 231-235 ◽  
Author(s):  
Quang Nguyen ◽  
Razvigor Ossikovski ◽  
Joachim Schreiber
Keyword(s):  
Raman Spectroscopy ◽  
Contrast Enhancement ◽  
Crystalline Silicon ◽  
Reflection Mode ◽  
Tip Enhanced Raman Spectroscopy

Surface-and tip-enhanced Raman spectroscopy of silicon

2008 ◽  
Author(s):  
K. J. Yi ◽  
X. N. He ◽  
W. Q. Yang ◽  
Y. S. Zhou ◽  
W. Xiong ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Tip Enhanced Raman Spectroscopy

Capability of tip-enhanced Raman spectroscopy about nanoscale analysis of strained silicon for semiconductor devices production

2017 ◽  
Vol 110 (10) ◽  
pp. 103105 ◽  
Author(s):  
Arianna Lucia ◽  
Onofrio Antonino Cacioppo ◽  
Enrico Iulianella ◽  
Luca Latessa ◽  
Giuseppe Moccia ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Semiconductor Devices ◽  
Strained Silicon ◽  
Tip Enhanced Raman Spectroscopy

Recent Advances in Tip-Enhanced Raman Spectroscopy

2014 ◽  
Vol 5 (18) ◽  
pp. 3125-3130 ◽  
Author(s):  
Matthew D. Sonntag ◽  
Eric A. Pozzi ◽  
Nan Jiang ◽  
Mark C. Hersam ◽  
Richard P. Van Duyne
Keyword(s):  
Raman Spectroscopy ◽  
Recent Advances ◽  
Tip Enhanced Raman Spectroscopy
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