Optical constant determination of an anisotropic thin film via surface plasmon resonance: analyzed by sensitivity calculation

2005 ◽  
Vol 244 (1-6) ◽  
pp. 269-277 ◽  
Author(s):  
Yi-Jun Jen ◽  
Cheng-Hung Hsieh ◽  
Tsai-Sheng Lo
Keyword(s):  
Thin Film ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Optical Constant ◽  
Plasmon Resonance ◽  
Sensitivity Calculation ◽  
Constant Determination

scholarly journals Design and Optimization of Surface Plasmon Resonance Spectroscopy for Optical Constant Characterization and Potential Sensing Application: Theoretical and Experimental Approaches

Photonics ◽  
2021 ◽  
Vol 8 (9) ◽  
pp. 361 ◽  
Author(s):  
Wan Mohd Ebtisyam Mustaqim Mohd Daniyal ◽  
Yap Wing Fen ◽  
Jaafar Abdullah ◽  
Amir Reza Sadrolhosseini ◽  
Mohd Adzir Mahdi
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Optical Constant ◽  
Plasmon Resonance ◽  
Copper Ion ◽  
Excitation Wavelength ◽  
K Value ◽  
N Value

The best surface plasmon resonance (SPR) signal can be generated based on several factors that include the excitation wavelength, the type of metal used, and the thickness of the metal layer. In this study, the aforementioned factors have been investigated to obtain the best SPR signal. The excitation wavelength of 633 nm and gold metal with thickness of 50 nm were required to generate the SPR signal before the SPR was used for optical constant characterization by fitting of experimental results to the theoretical data. The employed strategy has good agreement with the theoretical value where the real part refractive index, n value, of the gold thin film was 0.1245 while the value for the imaginary part, k, was 3.6812 with 47.7 nm thickness. Besides that, the optical characterization of nanocrystalline cellulose (NCC)-based thin film has also been demonstrated. The n and k values found for this thin film were 1.4240 and 0.2520, respectively, with optimal thickness of 9.5 nm. Interestingly when the NCC-based thin film was exposed to copper ion solution with n value of 1.3333 and k value of 0.0060 to 0.0070 with various concentrations (0.01–10 ppm), a clear change of the refractive index value was observed. This result suggests that the NCC-based thin film has high potential for copper ion sensing using SPR with a sensitivity of 8.0052°/RIU.

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

scholarly journals Cellulose and Vanadium Plasmonic Sensor to Measure Ni2+ Ions

2021 ◽  
Vol 11 (7) ◽  
pp. 2963
Author(s):  
Nur Alia Sheh Omar ◽  
Yap Wing Fen ◽  
Irmawati Ramli ◽  
Umi Zulaikha Mohd Azmi ◽  
Hazwani Suhaila Hashim ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Signal To Noise Ratio ◽  
Affinity Constant ◽  
Detection Accuracy ◽  
Plasmonic Sensor ◽  
Spr Sensor ◽  
Resonance Sensor

A novel vanadium–cellulose composite thin film-based on angular interrogation surface plasmon resonance (SPR) sensor for ppb-level detection of Ni(II) ion was developed. Experimental results show that the sensor has a linear response to the Ni(II) ion concentrations in the range of 2–50 ppb with a determination coefficient (R2) of 0.9910. This SPR sensor can attain a maximum sensitivity (0.068° ppb−1), binding affinity constant (1.819 × 106 M−1), detection accuracy (0.3034 degree−1), and signal-to-noise-ratio (0.0276) for Ni(II) ion detection. The optical properties of thin-film targeting Ni(II) ions in different concentrations were obtained by fitting the SPR reflectance curves using the WinSpall program. All in all, the proposed Au/MPA/V–CNCs–CTA thin-film-based surface plasmon resonance sensor exhibits better sensing performance than the previous film-based sensor and demonstrates a wide and promising technology candidate for environmental monitoring applications in the future.

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