Role of the SiO2 buffer layer thickness in the formation of Si/SiO2/nc-Ge/SiO2 structures by dry oxidation
2006 ◽
Vol 249
(1-2)
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pp. 306-309
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2014 ◽
Vol 52
(9)
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pp. 739-744
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2011 ◽
Vol 11
(2)
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pp. 1409-1412
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Keyword(s):
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2004 ◽
Vol 262
(1-4)
◽
pp. 456-460
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