A highly adaptive detector system for high resolution neutron imaging

Author(s):  
N. Kardjilov ◽  
M. Dawson ◽  
A. Hilger ◽  
I. Manke ◽  
M. Strobl ◽  
...  
2020 ◽  
Vol 8 ◽  
pp. 100121
Author(s):  
Noémie Ott ◽  
Claudia Cancellieri ◽  
Pavel Trtik ◽  
Patrik Schmutz

2021 ◽  
Vol 7 (1) ◽  
pp. 4
Author(s):  
Katsuya Hirota ◽  
Tomoko Ariga ◽  
Masahiro Hino ◽  
Go Ichikawa ◽  
Shinsuke Kawasaki ◽  
...  

A neutron detector using a fine-grained nuclear emulsion has a sub-micron spatial resolution and thus has potential to be applied as high-resolution neutron imaging. In this paper, we present two approaches to applying the emulsion detectors for neutron imaging. One is using a track analysis to derive the reaction points for high resolution. From an image obtained with a 9 μm pitch Gd grating with cold neutrons, periodic peak with a standard deviation of 1.3 μm was observed. The other is an approach without a track analysis for high-density irradiation. An internal structure of a crystal oscillator chip, with a scale of approximately 30 μm, was able to be observed after an image analysis.


2011 ◽  
Vol 159 (2) ◽  
pp. B235-B245 ◽  
Author(s):  
P. Oberholzer ◽  
P. Boillat ◽  
R. Siegrist ◽  
R. Perego ◽  
A. Kästner ◽  
...  

2008 ◽  
Vol 15 (5) ◽  
pp. 427-432 ◽  
Author(s):  
Peter L. Lee ◽  
Deming Shu ◽  
Mohan Ramanathan ◽  
Curt Preissner ◽  
Jun Wang ◽  
...  

2001 ◽  
Vol 34 (3) ◽  
pp. 343-357 ◽  
Author(s):  
A. D. Stoica ◽  
M. Popovici ◽  
C. R. Hubbard

Neutron imaging with bent crystals is considered in the linear approximation of neutron optics. A matrix formalism analogous to that of conventional lens optics is developed. Various imaging conditions are discussed in relation to the crystal deformation type and to possible applications in neutron scattering. All focusing conditions known previously are included as particular cases. Arrangements combining high resolution in imaging with high resolution in scattering are examined. The concept of Bragg mirrors as devices for non-dispersive imaging is introduced. The most powerful application appears to be that of Bragg mirrors combined with the time-of-flight method. Imaging with a thick packet of silicon wafers at the spatial resolution of a single thin wafer is demonstrated.


2001 ◽  
Author(s):  
Steven M. Ebstein ◽  
Charles C. Shortlidge

2007 ◽  
Vol 34 (6Part20) ◽  
pp. 2585-2585
Author(s):  
S Rudin ◽  
A Kuhls ◽  
C Keleshis ◽  
D Kim ◽  
G Yadava ◽  
...  

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