X-ray tomography systems for observations of electron cyclotron heated plasmas using novel position-sensitive X-ray semiconductor-detector arrays

2007 ◽  
Vol 573 (1-2) ◽  
pp. 53-56 ◽  
Author(s):  
T. Numakura ◽  
T. Cho ◽  
J. Kohagura ◽  
M. Hirata ◽  
Y. Tomii ◽  
...  
Keyword(s):  
Semiconductor Detector ◽  
Electron Cyclotron ◽  
Detector Arrays ◽  
X Ray ◽  
Position Sensitive

CdTe and CdZnTe semiconductor detector arrays for fast spectroscopic x-ray imaging

2009 ◽  
Author(s):  
A. Brambilla ◽  
P. Ouvrier-Buffet ◽  
G. Gonon ◽  
J. Rinkel ◽  
L. Verger ◽  
...  
Keyword(s):  
Semiconductor Detector ◽  
Detector Arrays ◽  
X Ray ◽  
X Ray Imaging

Fast CdTe and CdZnTe Semiconductor Detector Arrays for Spectroscopic X-Ray Imaging

2013 ◽  
Vol 60 (1) ◽  
pp. 408-415 ◽  
Author(s):  
Andrea Brambilla ◽  
P. Ouvrier-Buffet ◽  
G. Gonon ◽  
J. Rinkel ◽  
V. Moulin ◽  
...  
Keyword(s):  
Semiconductor Detector ◽  
Detector Arrays ◽  
X Ray ◽  
X Ray Imaging

Control of the phase composition of advanced calcium phosphates using an x-ray diffractometer with a curved position-sensitive detector

2020 ◽  
Vol 86 (6) ◽  
pp. 29-35
Author(s):  
V. P. Sirotinkin ◽  
O. V. Baranov ◽  
A. Yu. Fedotov ◽  
S. M. Barinov
Keyword(s):  
Phase Composition ◽  
Calcium Phosphates ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray Diffraction ◽  
X Ray ◽  
Impurity Phases ◽  
Position Sensitive ◽  
Diffraction Peaks ◽  
Diffraction Patterns

The results of studying the phase composition of advanced calcium phosphates Ca10(PO4)6(OH)2, β-Ca3(PO4)2, α-Ca3(PO4)2, CaHPO4 · 2H2O, Ca8(HPO4)2(PO4)4 · 5H2O using an x-ray diffractometer with a curved position-sensitive detector are presented. Optimal experimental conditions (angular positions of the x-ray tube and detector, size of the slits, exposure time) were determined with allowance for possible formation of the impurity phases during synthesis. The construction features of diffractometers with a position-sensitive detector affecting the profile characteristics of x-ray diffraction peaks are considered. The composition for calibration of the diffractometer (a mixture of sodium acetate and yttrium oxide) was determined. Theoretical x-ray diffraction patterns for corresponding calcium phosphates are constructed on the basis of the literature data. These x-ray diffraction patterns were used to determine the phase composition of the advanced calcium phosphates. The features of advanced calcium phosphates, which should be taken into account during the phase analysis, are indicated. The powder of high-temperature form of tricalcium phosphate strongly adsorbs water from the environment. A strong texture is observed on the x-ray diffraction spectra of dicalcium phosphate dihydrate. A rather specific x-ray diffraction pattern of octacalcium phosphate pentahydrate revealed the only one strong peak at small angles. In all cases, significant deviations are observed for the recorded angular positions and relative intensity of the diffraction peaks. The results of the study of experimentally obtained mixtures of calcium phosphate are presented. It is shown that the graphic comparison of experimental x-ray diffraction spectra and pre-recorded spectra of the reference calcium phosphates and possible impurity phases is the most effective method. In this case, there is no need for calibration. When using this method, the total time for analysis of one sample is no more than 10 min.

Sign in / Sign up

Export Citation Format

Share Document