Spatially resolved electron cyclotron heated plasmas using novel matrix-type X-ray semiconductor–detector arrays

2003 ◽  
Vol 513 (1-2) ◽  
pp. 304-307 ◽  
Author(s):  
R. Minami ◽  
T. Cho ◽  
J. Kohagura ◽  
M. Hirata ◽  
T. Numakura ◽  
...  
Keyword(s):  
Semiconductor Detector ◽  
Electron Cyclotron ◽  
Matrix Type ◽  
Detector Arrays ◽  
X Ray ◽  
Spatially Resolved

CdTe and CdZnTe semiconductor detector arrays for fast spectroscopic x-ray imaging

2009 ◽  
Author(s):  
A. Brambilla ◽  
P. Ouvrier-Buffet ◽  
G. Gonon ◽  
J. Rinkel ◽  
L. Verger ◽  
...  
Keyword(s):  
Semiconductor Detector ◽  
Detector Arrays ◽  
X Ray ◽  
X Ray Imaging

Fast CdTe and CdZnTe Semiconductor Detector Arrays for Spectroscopic X-Ray Imaging

2013 ◽  
Vol 60 (1) ◽  
pp. 408-415 ◽  
Author(s):  
Andrea Brambilla ◽  
P. Ouvrier-Buffet ◽  
G. Gonon ◽  
J. Rinkel ◽  
V. Moulin ◽  
...  
Keyword(s):  
Semiconductor Detector ◽  
Detector Arrays ◽  
X Ray ◽  
X Ray Imaging

Layered and ion implantation specimens as possible reference materials for the electron-probe microanalysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1652-1653
Author(s):  
G. Remond ◽  
R.H. Packwood ◽  
C. Gilles ◽  
S. Chryssoulis
Keyword(s):  
Ion Implantation ◽  
Reference Materials ◽  
Analytical Techniques ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
X Ray ◽  
Spatially Resolved ◽  
Analytical Expressions ◽  
Original Approach ◽  
Depth Concentration

Merits and limitations of layered and ion implanted specimens as possible reference materials to calibrate spatially resolved analytical techniques are discussed and illustrated for the case of gold analysis in minerals by means of x-ray spectrometry with the EPMA. To overcome the random heterogeneities of minerals, thin film deposition and ion implantation may offer an original approach to the manufacture of controlled concentration/ distribution reference materials for quantification of trace elements with the same matrix as the unknown.In order to evaluate the accuracy of data obtained by EPMA we have compared measured and calculated x-ray intensities for homogeneous and heterogeneous specimens. Au Lα and Au Mα x-ray intensities were recorded at various electron beam energies, and hence at various sampling depths, for gold coated and gold implanted specimens. X-ray intensity calculations are based on the use of analytical expressions for both the depth ionization Φ (ρz) and the depth concentration C (ρz) distributions respectively.

scholarly journals Sample Environment for Operando Hard X-ray Tomography—An Enabling Technology for Multimodal Characterization in Heterogeneous Catalysis

Catalysts ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 459
Author(s):  
Johannes Becher ◽  
Sebastian Weber ◽  
Dario Ferreira Sanchez ◽  
Dmitry E. Doronkin ◽  
Jan Garrevoet ◽  
...  
Keyword(s):  
Heterogeneous Catalysis ◽  
Synchrotron Radiation ◽  
Contrast Imaging ◽  
Co2 Methanation ◽  
Full Field ◽  
X Ray ◽  
Spatially Resolved ◽  
Oxidation Of Methane ◽  
Unique Source ◽  
Sample Environment

Structure–activity relations in heterogeneous catalysis can be revealed through in situ and operando measurements of catalysts in their active state. While hard X-ray tomography is an ideal method for non-invasive, multimodal 3D structural characterization on the micron to nm scale, performing tomography under controlled gas and temperature conditions is challenging. Here, we present a flexible sample environment for operando hard X-ray tomography at synchrotron radiation sources. The setup features are discussed, with demonstrations of operando powder X-ray diffraction tomography (XRD-CT) and energy-dispersive tomographic X-ray absorption spectroscopy (ED-XAS-CT). Catalysts for CO2 methanation and partial oxidation of methane are shown as case studies. The setup can be adapted for different hard X-ray microscopy, spectroscopy, or scattering synchrotron radiation beamlines, is compatible with absorption, diffraction, fluorescence, and phase-contrast imaging, and can operate with scanning focused beam or full-field acquisition mode. We present an accessible methodology for operando hard X-ray tomography studies, which offer a unique source of 3D spatially resolved characterization data unavailable to contemporary methods.

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