Radiation Hardened by Design Latches — A Review and SEU Fault Simulations

2018 ◽  
Vol 83 ◽  
pp. 127-135 ◽  
Author(s):  
Faisal Mustafa Sajjade ◽  
Neeraj Kumar Goyal ◽  
B.K.S.V.L. Varaprasad ◽  
Ravindra Moogina
Keyword(s):  
Radiation Hardened ◽  
Radiation Hardened By Design

scholarly journals Categorization and SEU Fault Simulations of Radiation-Hardened-by-Design Flip-Flops

Electronics ◽  
2021 ◽  
Vol 10 (13) ◽  
pp. 1572
Author(s):  
Ehab A. Hamed ◽  
Inhee Lee
Keyword(s):  
Soft Error ◽  
Error Tolerance ◽  
Cmos Process ◽  
Flip Flop ◽  
Single Event Upsets ◽  
Area Overhead ◽  
Fair Comparison ◽  
Reference Design ◽  
Radiation Hardened ◽  
Radiation Hardened By Design

In the previous three decades, many Radiation-Hardened-by-Design (RHBD) Flip-Flops (FFs) have been designed and improved to be immune to Single Event Upsets (SEUs). Their specifications are enhanced regarding soft error tolerance, area overhead, power consumption, and delay. In this review, previously presented RHBD FFs are classified into three categories with an overview of each category. Six well-known RHBD FFs architectures are simulated using a 180 nm CMOS process to show a fair comparison between them while the conventional Transmission Gate Flip-Flop (TGFF) is used as a reference design for this comparison. The results of the comparison are analyzed to give some important highlights about each design.

Radiation Hardened by Design Subsampling Phase-Locked Loop Techniques in PD-SOI

2020 ◽  
Vol 67 (6) ◽  
pp. 1144-1151
Author(s):  
Ellis W. Richards ◽  
T. D. Loveless ◽  
J. S. Kauppila ◽  
T. D. Haeffner ◽  
W. T. Holman ◽  
...  
Keyword(s):  
Phase Locked Loop ◽  
Radiation Hardened ◽  
Radiation Hardened By Design

A novel radiation hardened by design latch

2009 ◽  
Vol 30 (3) ◽  
pp. 035007 ◽  
Author(s):  
Huang Zhengfeng ◽  
Liang Huaguo
Keyword(s):  
Radiation Hardened ◽  
Radiation Hardened By Design
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