Permanent and single event transient faults reliability evaluation EDA tool

Microelectronics Reliability ◽

10.1016/j.microrel.2016.07.072 ◽

2016 ◽

Vol 64 ◽

pp. 63-67 ◽

Cited By ~ 3

Author(s):

Y.Q. de Aguiar ◽

A.L. Zimpeck ◽

C. Meinhardt ◽

R. Reis

Keyword(s):

Reliability Evaluation ◽

Transient Faults ◽

Single Event ◽

Single Event Transient

Download Full-text

Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults

2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) ◽

10.1109/icecs.2018.8617918 ◽

2018 ◽

Cited By ~ 3

Author(s):

Rafael Schvittz ◽

Denis T. Franco ◽

Leomar S. Rosa ◽

Paulo F. Butzen

Keyword(s):

Probabilistic Method ◽

Reliability Estimation ◽

Transient Faults ◽

Single Event ◽

Single Event Transient

Download Full-text

A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates

2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) ◽

10.1109/vlsi-soc.2019.8920333 ◽

2019 ◽

Cited By ~ 1

Author(s):

Rafael Schvittz ◽

Denis Teixeira Franco ◽

Leomar Soares ◽

Paulo Francisco Butzen

Keyword(s):

Logic Gates ◽

Transient Faults ◽

Single Event ◽

Single Event Transient ◽

Level Method

Download Full-text

In-Place FPGA Retiming for Mitigation of Variational Single-Event Transient Faults

IEEE Transactions on Circuits and Systems I Regular Papers ◽

10.1109/tcsi.2010.2094370 ◽

2011 ◽

Vol 58 (6) ◽

pp. 1372-1381 ◽

Cited By ~ 7

Author(s):

Wenyao Xu ◽

Jia Wang ◽

Yu Hu ◽

Ju-Yueh Lee ◽

Fang Gong ◽

...

Keyword(s):

Transient Faults ◽

Single Event ◽

Single Event Transient

Download Full-text

An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults

IFIP Advances in Information and Communication Technology - VLSI-SoC: New Technology Enabler ◽

10.1007/978-3-030-53273-4_4 ◽

2020 ◽

pp. 69-88

Author(s):

Rafael B. Schvittz ◽

Denis T. Franco ◽

Leomar S. da Rosa ◽

Paulo F. Butzen

Keyword(s):

Logic Gate ◽

Transient Faults ◽

Single Event ◽

Single Event Transient ◽

Improved Technique ◽

Susceptibility Evaluation

Download Full-text

Single Event Transient (SET) Mitigation Circuits with Immune Leaf Nodes

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2021.3051846 ◽

2021 ◽

pp. 1-1

Author(s):

Faisal Mustafa Sajjade ◽

Neeraj Kumar Goyal ◽

B.K.S.V.L Varaprasad

Keyword(s):

Single Event ◽

Single Event Transient

Download Full-text

Impact of displacement damage on single event transient charge collection in SiGe HBTs

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2019.05.098 ◽

2019 ◽

Vol 938 ◽

pp. 29-35 ◽

Cited By ~ 1

Author(s):

Jia-nan Wei ◽

Chao-hui He ◽

Pei Li ◽

Yong-hong Li ◽

Hong-xia Guo

Keyword(s):

Charge Collection ◽

Single Event ◽

Single Event Transient ◽

Displacement Damage

Download Full-text

Single event transient characterisation of analog IC's for ESA's satellites

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858650 ◽

2003 ◽

Cited By ~ 8

Author(s):

R. Harboe-Sorensen ◽

F.X. Guerre ◽

H. Constans ◽

J. van Dooren ◽

G. Berger ◽

...

Keyword(s):

Single Event ◽

Single Event Transient

Download Full-text

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896269 ◽

2002 ◽

Cited By ~ 20

Author(s):

R. Koga ◽

S.H. Crain ◽

K.B. Crawford ◽

S.C. Moss ◽

S.D. LaLumondiere ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Radiation Hardened

Download Full-text

Single-event transient (SET) characterization of a LM119 voltage comparator: an approach to SET model validation using a pulsed laser

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) ◽

10.1109/radecs.2001.1159318 ◽

2005 ◽

Cited By ~ 1

Author(s):

S. Buchner ◽

D. McMorrow ◽

A. Sternberg ◽

L. Massengill ◽

R.L. Pease ◽

...

Keyword(s):

Model Validation ◽

Pulsed Laser ◽

Single Event ◽

Single Event Transient ◽

Voltage Comparator

Download Full-text

Investigation of a layout technique for single-event transient mitigation

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2016.7998689 ◽

2016 ◽

Author(s):

Luo Sheng ◽

He Wei ◽

Zhang Zhun ◽

He Lingxiang ◽

Cao Jianmin ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Layout Technique

Download Full-text