Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop
2012 ◽
Vol 52
(9-10)
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pp. 2188-2193
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2008 ◽
Vol 128
(6)
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pp. 885-889
Keyword(s):
2010 ◽
Vol 93
(6)
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pp. 19-24
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1995 ◽
Vol 44
(1-3)
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pp. 520-523