Performance of nonvolatile memory by using band-engineered SrTiO3/HfON stack as charge-trapping layer

X.D. Huang; P.T. Lai; Johnny K.O. Sin

doi:10.1016/j.microrel.2012.04.006

Performance of nonvolatile memory by using band-engineered SrTiO3/HfON stack as charge-trapping layer

Microelectronics Reliability ◽

10.1016/j.microrel.2012.04.006 ◽

2012 ◽

Vol 52 (11) ◽

pp. 2527-2531 ◽

Cited By ~ 3

Author(s):

X.D. Huang ◽

P.T. Lai ◽

Johnny K.O. Sin

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping

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Novel SONOS-Type Nonvolatile Memory Device With Optimal Al Doping in HfAlO Charge-Trapping Layer

IEEE Electron Device Letters ◽

10.1109/led.2007.915380 ◽

2008 ◽

Vol 29 (3) ◽

pp. 265-268 ◽

Cited By ~ 34

Author(s):

Ping-Hung Tsai ◽

Kuei-Shu Chang-Liao ◽

Chu-Yung Liu ◽

Tien-Ko Wang ◽

P. J. Tzeng ◽

...

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping ◽

Memory Device ◽

Al Doping ◽

Nonvolatile Memory Device

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Al2O3–Cu2O composite charge-trapping nonvolatile memory

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-016-5609-8 ◽

2016 ◽

Vol 28 (1) ◽

pp. 928-933 ◽

Cited By ~ 2

Author(s):

Jinqiu Liu ◽

Jianxin Lu ◽

Bo Xu ◽

Yidong Xia ◽

Jiang Yin ◽

...

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping ◽

Composite Charge

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Thermal Annealing for Improving Gold Nano-particles Charge Trapping Layer Nonvolatile Memory Reliability Applications

2014 International Symposium on Computer, Consumer and Control ◽

10.1109/is3c.2014.126 ◽

2014 ◽

Author(s):

Hsin Chiang You ◽

Yu Hsien Lin ◽

Sheng Jyun Wu

Keyword(s):

Thermal Annealing ◽

Nonvolatile Memory ◽

Charge Trapping ◽

Nano Particles ◽

Gold Nano Particles

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High reliable and stable organic field-effect transistor nonvolatile memory with a poly(4-vinyl phenol) charge trapping layer based on a pn-heterojunction active layer

Applied Physics Letters ◽

10.1063/1.4947576 ◽

2016 ◽

Vol 108 (17) ◽

pp. 173301 ◽

Cited By ~ 12

Author(s):

Lanyi Xiang ◽

Jun Ying ◽

Jinhua Han ◽

Letian Zhang ◽

Wei Wang

Keyword(s):

Active Layer ◽

Nonvolatile Memory ◽

Field Effect ◽

Field Effect Transistor ◽

Charge Trapping ◽

Organic Field Effect Transistor ◽

Effect Transistor ◽

Vinyl Phenol

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High-K HfAlO charge trapping layer in SONOS-type nonvolatile memory device for high speed operation

IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. ◽

10.1109/iedm.2004.1419323 ◽

2005 ◽

Cited By ~ 14

Author(s):

Yan Ny Tan ◽

Wai Kin Chim ◽

Wee Kiong Choi ◽

Moon Sig Joe ◽

Tsu Hau Ng ◽

...

Keyword(s):

Nonvolatile Memory ◽

High Speed ◽

Charge Trapping ◽

Memory Device ◽

High K ◽

Nonvolatile Memory Device

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Charge trapping process of nonvolatile memory devices based on CdTe and CdTe–CdSe core-shell nanoparticles/poly(methylmethacrylate) nanocomposites

Applied Physics Letters ◽

10.1063/1.3596705 ◽

2011 ◽

Vol 98 (24) ◽

pp. 243306 ◽

Cited By ~ 11

Author(s):

Dong Yeol Yun ◽

Jung Min Son ◽

Tae Whan Kim ◽

Sung Woo Kim ◽

Sang Wook Kim

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping ◽

Core Shell ◽

Memory Devices ◽

Cdse Core ◽

Shell Nanoparticles ◽

Nonvolatile Memory Devices ◽

Core Shell Nanoparticles ◽

Trapping Process

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Charge-trapping characteristics of niobium-doped La2O3 for nonvolatile memory applications

2013 IEEE International Conference of Electron Devices and Solid-state Circuits ◽

10.1109/edssc.2013.6628190 ◽

2013 ◽

Author(s):

R. P. Shi ◽

X. D. Huang ◽

C.H. Leung ◽

P. T. Lai

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping ◽

Niobium Doped ◽

Memory Applications

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Cubic ZrO2 as Charge-Trapping Layer for Nonvolatile Memory Application

ECS Meeting Abstracts ◽

10.1149/ma2010-01/1/48 ◽

2010 ◽

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping

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Charge Trapping Nonvolatile Memory

ECS Meeting Abstracts ◽

10.1149/ma2009-02/31/2382 ◽

2009 ◽

Keyword(s):

Nonvolatile Memory ◽

Charge Trapping

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Low-Dielectric Constant SiCN Charge Trapping Layer for Nonvolatile Memory Applications

ECS Meeting Abstracts ◽

10.1149/ma2013-02/27/2007 ◽

2013 ◽

Keyword(s):

Dielectric Constant ◽

Nonvolatile Memory ◽

Charge Trapping ◽

Low Dielectric Constant ◽

Low Dielectric ◽

Memory Applications

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