Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism

2012 ◽  
Vol 52 (6) ◽  
pp. 1227-1232 ◽  
Author(s):  
Jianjun Chen ◽  
Shuming Chen ◽  
Bin Liang ◽  
Biwei Liu ◽  
Fanyu Liu
Keyword(s):  
Pulse Width ◽  
Physical Mechanism ◽  
Single Event ◽  
Single Event Transient ◽  
Radiation Hardened ◽  
Radiation Hardened By Design ◽  
Design Techniques

Analysis of single event transient pulse-width in 65 nm commercial radiation-hardened logic cell

2017 ◽  
Vol 38 (8) ◽  
pp. 085009 ◽  
Author(s):  
Haisong Li ◽  
Longsheng Wu ◽  
Bo Yang ◽  
Yihu Jiang
Keyword(s):  
Pulse Width ◽  
Single Event ◽  
Single Event Transient ◽  
Radiation Hardened

Single-Event Transient Error Characterization of a Radiation-Hardened by Design 90 nm SerDes Transmitter Driver

2009 ◽  
Vol 56 (6) ◽  
pp. 3463-3468 ◽  
Author(s):  
S. E. Armstrong ◽  
B. D. Olson ◽  
J. Popp ◽  
J. Braatz ◽  
T. D. Loveless ◽  
...  
Keyword(s):  
Single Event ◽  
Single Event Transient ◽  
Error Characterization ◽  
Radiation Hardened ◽  
Transient Error ◽  
Radiation Hardened By Design
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