Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling

2005 ◽  
Vol 45 (9-11) ◽  
pp. 1568-1571 ◽  
Author(s):  
Peter Breitschopf ◽  
Günther Benstetter ◽  
Bernhard Knoll ◽  
Werner Frammelsberger
Keyword(s):  
Improved Method ◽  
Scanning Capacitance Microscopy ◽  
Intermittent Contact

Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling

2008 ◽  
Vol 48 (8-9) ◽  
pp. 1339-1342 ◽  
Author(s):  
Roland Biberger ◽  
Guenther Benstetter ◽  
Thomas Schweinboeck ◽  
Peter Breitschopf ◽  
Holger Goebel
Keyword(s):  
Contact Mode ◽  
Scanning Capacitance Microscopy ◽  
Dopant Profiling ◽  
Intermittent Contact

An Improved Method for the Preparation and TEM Examination of Sharp Pointed Tips used in APFIM and STM

1990 ◽  
Vol 48 (2) ◽  
pp. 102-103
Author(s):  
E.A. Fischione ◽  
P.E. Fischione ◽  
J.J. Haugh ◽  
M.G. Burke
Keyword(s):  
Atom Probe ◽  
Preparation Process ◽  
Improved Method ◽  
Ion Milling ◽  
Polishing Process ◽  
Probe Field ◽  
Scanning Tunnelling ◽  
Stm Tips ◽  
Tunnelling Microscopy ◽  
Ion Microscopy

A common requirement for both Atom Probe Field-Ion Microscopy (APFIM) and Scanning Tunnelling Microscopy (STM) is a sharp pointed tip for use as either the specimen (APFIM) or the probe (STM). Traditionally, tips have been prepared by either chemical or electropolishing techniques. Recently, ion-milling has been successfully employed in the production of APFIM tips [1]. Conventional electropolishing techniques are applicable to a wide variety of metals, but generally require careful manual adjustments during the polishing process and may also be time-consuming. In order to reduce the time and effort involved in the preparation process, a compact, self-contained polishing unit has been developed. This system is based upon the conventional two-stage electropolishing technique in which the specimen/tip blank is first locally thinned or “necked”, and subsequently electropolished until separation occurs.[2,3] The result of this process is the production of two APFIM or STM tips. A mechanized polishing unit that provides these functions while automatically maintaining alignment has been designed and developed.

Immunoelectron microscopic localization of elastic tissue in archival material using an improved method

1990 ◽  
Vol 48 (3) ◽  
pp. 794-795
Author(s):  
J. C. Fanning ◽  
J. F. White ◽  
R. Polewski ◽  
E. G. Cleary
Keyword(s):  
Normal Animal ◽  
Animal Tissue ◽  
Elastic Tissue ◽  
Human Tissues ◽  
Improved Method ◽  
Tissue Samples ◽  
Archival Material ◽  
Immuno Electron Microscopy ◽  
Arteries And Veins ◽  
Biochemical Examination

Elastic tissue is an important component of the walls of arteries and veins, of skin, of the lungs and in lesser amounts, of many other tissues. It is responsible for the rubber-like properties of the arteries and for the normal texture of young skin. It undergoes changes in a number of important diseases such as atherosclerosis and emphysema and on exposure of skin to sunlight.We have recently described methods for the localizationof elastic tissue components in normal animal and human tissues. In the study of developing and diseased tissues it is often not possible to obtain samples which have been optimally prepared for immuno-electron microscopy. Sometimes there is also a need to examine retrospectively samples collected some years previously. We have therefore developed modifications to our published methods to allow examination of human and animal tissue samples obtained at surgery or during post mortem which have subsequently been: 1. stored frozen at -35° or -70°C for biochemical examination; 2.

Intensifying Negatives–Improved Method

1895 ◽  
Vol 39 (1003supp) ◽  
pp. 16026-16027
Author(s):  
John Vansant
Keyword(s):  
Improved Method
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