Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies

2005 ◽  
Vol 45 (3-4) ◽  
pp. 487-492 ◽  
Author(s):  
D. Goguenheim ◽  
A. Bravaix ◽  
S. Gomri ◽  
J.M. Moragues ◽  
C. Monserie ◽  
...  
Keyword(s):  
Damage Detection ◽  
Hot Carrier ◽  
Wafer Charging

PERIODIC OSCILLATIONS AND TURBULENCE OF HOT-CARRIER PLASMA AT 4.2 K IN n-GaAs

1981 ◽  
Vol 42 (C7) ◽  
pp. C7-51-C7-56
Author(s):  
K. Aoki ◽  
T. Kobayashi ◽  
K. Yamamoto
Keyword(s):  
Periodic Oscillations ◽  
Hot Carrier

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation

Antioptimization for comparison of alternative structural models and damage detection

AIAA Journal ◽  
1999 ◽  
Vol 37 ◽  
pp. 857-864
Author(s):  
S. N. Gangadharan ◽  
E. Nikolaidis ◽  
K. Lee ◽  
R. T. Haftka ◽  
R. Burdisso
Keyword(s):  
Damage Detection ◽  
Structural Models

Eigenstructure assignment technique for damage detection in rotating structures

AIAA Journal ◽  
1998 ◽  
Vol 36 ◽  
pp. 1680-1685
Author(s):  
Jason Kiddy ◽  
Darryll Pines
Keyword(s):  
Damage Detection ◽  
Eigenstructure Assignment
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