Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics

doi:10.1016/j.microrel.2004.07.048

Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics

Microelectronics Reliability ◽

10.1016/j.microrel.2004.07.048 ◽

2004 ◽

Vol 44 (9-11) ◽

pp. 1509-1512 ◽

Cited By ~ 50

Keyword(s):

Gate Dielectrics ◽

Reliability Assessment ◽

High K

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Mechanism of Gradual Increase of Gate Current in High-K Gate Dielectrics and Its Application to Reliability Assessment

2006 IEEE International Reliability Physics Symposium Proceedings ◽

10.1109/relphy.2006.251215 ◽

2006 ◽

Cited By ~ 8

Author(s):

Kenji Okada ◽

Tsuyoshi Horikawa ◽

Hideki Satake ◽

Hiroyuki Ota ◽

Arito Ogawa ◽

...

Keyword(s):

Gate Dielectrics ◽

Gradual Increase ◽

Reliability Assessment ◽

Gate Current ◽

High K

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Reliability Assessment of High-k Gate Dielectrics on Si-passivated p-GaAs under Dynamic and AC Stress

ECS Meeting Abstracts ◽

10.1149/ma2008-02/25/1925 ◽

2008 ◽

Keyword(s):

Gate Dielectrics ◽

Reliability Assessment ◽

High K

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In-plane-gate flexible single-crystalline silicon thin-film transistors with high-k gate dielectrics on plastic substrates

AIP Advances ◽

10.1063/1.5045521 ◽

2019 ◽

Vol 9 (1) ◽

pp. 015111 ◽

Cited By ~ 1

Author(s):

Yibo Zhang ◽

Shihui Yu ◽

Kuibo Lan ◽

Lingxia Li ◽

Guoxuan Qin

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Crystalline Silicon ◽

Gate Dielectrics ◽

Single Crystalline Silicon ◽

Silicon Thin Film ◽

Single Crystalline ◽

Plastic Substrates ◽

High K

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Plasmon-Phonon Resonance at Gate-Electrode/Gate-Dielectric Interface on Carrier Mobility of Organic TFTs with High-k Gate Dielectrics

Applied Surface Science ◽

10.1016/j.apsusc.2021.150374 ◽

2021 ◽

pp. 150374

Author(s):

Y.X. Ma ◽

H. Su ◽

W.M. Tang ◽

P.T. Lai

Keyword(s):

Carrier Mobility ◽

Gate Dielectric ◽

Gate Dielectrics ◽

Gate Electrode ◽

Dielectric Interface ◽

High K

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High K gate dielectrics for the silicon industry

Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) ◽

10.1109/iwgi.2001.967545 ◽

2002 ◽

Cited By ~ 8

Author(s):

L. Manchanda ◽

B. Busch ◽

M.L. Green ◽

M. Morris ◽

R.B. van Dover ◽

...

Keyword(s):

Gate Dielectrics ◽

High K

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Effect of reaction time on the dielectric behaviour of reduced graphene oxide–layered cobalt hydroxide composite for high-k gate dielectrics

Materials Research Bulletin ◽

10.1016/j.materresbull.2017.11.050 ◽

2018 ◽

Vol 100 ◽

pp. 7-14 ◽

Cited By ~ 2

Author(s):

N. Ambikeswari ◽

S. Manivannan

Keyword(s):

Graphene Oxide ◽

Reaction Time ◽

Reduced Graphene Oxide ◽

Gate Dielectrics ◽

Dielectric Behaviour ◽

Cobalt Hydroxide ◽

High K ◽

Reduced Graphene

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Strategic Customization of Polymeric Nanocomposites Modified by 2D Titanium Oxide Nanosheet for High‐ k and Flexible Gate Dielectrics

Small ◽

10.1002/smll.202007213 ◽

2021 ◽

Vol 17 (17) ◽

pp. 2007213

Author(s):

Moonjeong Jang ◽

Se Yeon Park ◽

Seong Ku Kim ◽

Dowon Jung ◽

Wooseok Song ◽

...

Keyword(s):

Titanium Oxide ◽

Gate Dielectrics ◽

Polymeric Nanocomposites ◽

High K

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Electrical properties of high-k ZrO/sub 2/ gate dielectrics on strained Ge-rich layers

2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) ◽

10.1109/icmel.2004.1314652 ◽

2004 ◽

Cited By ~ 1

Author(s):

S. Bhattacharya ◽

J. McCarthy ◽

B.M. Armstrong ◽

H.S. Gamble ◽

G.K. Dalapati ◽

...

Keyword(s):

Electrical Properties ◽

Gate Dielectrics ◽

High K

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The Current Conduction Issues in High-k Gate Dielectrics

2007 IEEE Conference on Electron Devices and Solid-State Circuits ◽

10.1109/edssc.2007.4450055 ◽

2007 ◽

Cited By ~ 3

Author(s):

Hei Wong

Keyword(s):

Gate Dielectrics ◽

High K ◽

Current Conduction

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Characteristics of different structure sub-100nm MOSFETs with high-k gate dielectrics

2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) ◽

10.1109/icsict.2001.981488 ◽

2002 ◽

Cited By ~ 2

Author(s):

Xiaoyan Liu ◽

Shuzuo Lou ◽

Zhiliang Xia ◽

Dechao Guo ◽

Huiwen Zhu ◽

...

Keyword(s):

Gate Dielectrics ◽

High K

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