Dielectric function of germanium nanocrystals between 0.6 and 6.5eV by spectroscopic ellipsometry

2006 ◽  
Vol 67 (5-6) ◽  
pp. 1291-1294 ◽  
Author(s):  
M. Mansour ◽  
A. En Naciri ◽  
L. Johann ◽  
S. Duguay ◽  
J.J. Grob ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Germanium Nanocrystals

Dielectric function of thin polypyrrole and Prussian blue films by spectroscopic ellipsometry

1983 ◽  
Vol 6 ◽  
pp. 309-316 ◽  
Author(s):  
H. Arwin ◽  
D.E. Aspnes ◽  
R. Bjorklund ◽  
I. Lundström
Keyword(s):  
Prussian Blue ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry

Dielectric function of ZnTe nanocrystals by spectroscopic ellipsometry

2009 ◽  
Vol 20 (30) ◽  
pp. 305702 ◽  
Author(s):  
F Ahmed ◽  
A En Naciri ◽  
J J Grob ◽  
M Stchakovsky ◽  
L Johann
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry

Measurement of the dielectric function spectra of low dielectric constant using the spectroscopic ellipsometry

2003 ◽  
Author(s):  
Masahiro Horie ◽  
Kamil Postava ◽  
Tomuo Yamaguchi ◽  
Kumiko Akashika ◽  
Hideki Hayashi ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Low Dielectric Constant ◽  
Low Dielectric

Dielectric function and magneto-optical Voigt constant of Cu2O: A combined spectroscopic ellipsometry and polar magneto-optical Kerr spectroscopy study

2011 ◽  
Vol 84 (19) ◽  
Author(s):  
Francisc Haidu ◽  
Michael Fronk ◽  
Ovidiu D. Gordan ◽  
Camelia Scarlat ◽  
Georgeta Salvan ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Spectroscopy Study

Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry

2001 ◽  
Vol 693 ◽  
Author(s):  
N.V. Edwards ◽  
O.P.A. Lindquist ◽  
L.D. Madsen ◽  
S. Zollner ◽  
K. Järrehdahl ◽  
...  
Keyword(s):  
Optical Properties ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Vacuum Ultraviolet ◽  
Critical Assessment ◽  
Optical Transitions ◽  
Common Substrate ◽  
Materials Used

AbstractAs a first step toward enabling the in-line metrology of III-V nitride heterostructure and materials, we present the optical constants of the two common substrate materials over an unprecendented spectral range. Vacuum Ultraviolet spectroscopic ellipsometry (VUVSE) was used to obtain the optical constants for Al2O3 and the ordinary and extra-ordinary component of the dielectric function for both 4H- and 6H-SiC. The results are discussed in the context of anisotropy, polytypism, bandstructure, optical transitions, and preparation/characterization of abrupt surfaces, where appropriate.

The Study of Damage Profile of Ion Implanted Layer on Si by Spectroscopic Ellipsometry

1982 ◽  
Vol 14 ◽  
Author(s):  
Jinshen Luo ◽  
P.J. Mc Marr ◽  
K. Vedam
Keyword(s):  
Dielectric Function ◽  
Spectral Range ◽  
Spectroscopic Ellipsometry ◽  
Ion Implanted

ABSTRACTWe have determined the dielectric function of silicon samples which were implanted with 100-150 KeV P, As, Si ions to doses of 2·1014-1·1016cm−2, by a rotating analyser Automated ellipsometer in the spectral range 1.77− 4.59 eV. These data have been analyzed using a simplified three layer model.The results are compared with an earlier ellipsometric investigation [2].

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