Energy recovery LINAC: A next generation source for inelastic X-ray scattering

2005 ◽  
Vol 66 (12) ◽  
pp. 2310-2312 ◽  
Author(s):  
K.D. Finkelstein ◽  
I.V. Bazarov ◽  
M. Liepe ◽  
Q. Shen ◽  
D. Bilderback ◽  
...  
Keyword(s):  
Energy Recovery ◽  
Next Generation ◽  
X Ray ◽  
X Ray Scattering ◽  
Energy Recovery Linac ◽  
Ray Scattering

scholarly journals Evaluation of 4-alkoxy-4′-nitrobiphenyl liquid crystals for use in next generation scattering LCDs

RSC Advances ◽  
2017 ◽  
Vol 7 (64) ◽  
pp. 40480-40485 ◽  
Author(s):  
Richard J. Mandle ◽  
Stephen J. Cowling ◽  
John W. Goodby
Keyword(s):  
Liquid Crystals ◽  
Electric Field ◽  
Applied Electric Field ◽  
Field Studies ◽  
Next Generation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A combination of microscopy, X-ray scattering, calorimetry and applied electric field studies demonstrates the 4-alkoxy-4′-nitrobiphenyls are potentially of use for next generation, backlight free scattering mode LCD devices.

scholarly journals X-ray Metrology for the SemiconductorIndustry Tutorial

2019 ◽  
Vol 124 ◽  
Author(s):  
Daniel F. Sunday ◽  
Wen-li Wu ◽  
Scott Barton ◽  
R. Joseph Kline
Keyword(s):  
Data Processing ◽  
Small Angle ◽  
Semiconductor Industry ◽  
Critical Dimension ◽  
Next Generation ◽  
Dimensional Metrology ◽  
X Ray ◽  
X Ray Scattering ◽  
Short Course ◽  
Ray Scattering

The semiconductor industry is in need of new, in-line dimensional metrology methods with higherspatial resolution for characterizing their next generation nanodevices. The purpose of this short course is to train the semiconductor industry on the NIST-developed critical dimension small angle X-ray scattering (CDSAXS) method. The topics will include both data processing and instrumentation. The short course will also provide an opportunity for discussion of the requirements for CDSAXS and the necessary improvements in X-ray source technology. Expected audience include semiconductor manufacturers, equipment manufacturers, and component manufacturers. The presentations were made at “X-ray Metrology for the Semiconductor Industry” short course at the National Institute of Standards and Technology on Aug. 25, 2016.

MERIX—Next generation medium energy resolution inelastic X-ray scattering instrument at the APS

2013 ◽  
Vol 188 ◽  
pp. 140-149 ◽  
Author(s):  
Yu.V. Shvyd’ko ◽  
J.P. Hill ◽  
C.A. Burns ◽  
D.S. Coburn ◽  
B. Brajuskovic ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Next Generation ◽  
Medium Energy ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Microtubule nucleation sequence studied by time-resolved x-ray scattering and electron microscopy

1983 ◽  
Vol 41 ◽  
pp. 766-767
Author(s):  
Eva-Maria Mandelkow ◽  
Eckhard Mandelkow ◽  
Joan Bordas
Keyword(s):  
Electron Microscopy ◽  
Dynamic Equilibrium ◽  
Time Resolved ◽  
X Ray ◽  
Additional Information ◽  
X Ray Scattering ◽  
Low Concentrations ◽  
Microtubule Growth ◽  
Ray Patterns ◽  
Ray Scattering

When a solution of microtubule protein is changed from non-polymerising to polymerising conditions (e.g. by temperature jump or mixing with GTP) there is a series of structural transitions preceding microtubule growth. These have been detected by time-resolved X-ray scattering using synchrotron radiation, and they may be classified into pre-nucleation and nucleation events. X-ray patterns are good indicators for the average behavior of the particles in solution, but they are difficult to interpret unless additional information on their structure is available. We therefore studied the assembly process by electron microscopy under conditions approaching those of the X-ray experiment. There are two difficulties in the EM approach: One is that the particles important for assembly are usually small and not very regular and therefore tend to be overlooked. Secondly EM specimens require low concentrations which favor disassembly of the particles one wants to observe since there is a dynamic equilibrium between polymers and subunits.

Time-Resolved Cryo-Electron Microscopy of Oscillating Microtubules

1990 ◽  
Vol 48 (1) ◽  
pp. 502-503
Author(s):  
Eva-Maria Mandelkow ◽  
Ron Milligan
Keyword(s):  
Electron Microscopy ◽  
Dynamic Instability ◽  
Entire Solution ◽  
Reaction Scheme ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
A Chain ◽  
Ray Scattering

Microtubules form part of the cytoskeleton of eukaryotic cells. They are hollow libers of about 25 nm diameter made up of 13 protofilaments, each of which consists of a chain of heterodimers of α-and β-tubulin. Microtubules can be assembled in vitro at 37°C in the presence of GTP which is hydrolyzed during the reaction, and they are disassembled at 4°C. In contrast to most other polymers microtubules show the behavior of “dynamic instability”, i.e. they can switch between phases of growth and phases of shrinkage, even at an overall steady state [1]. In certain conditions an entire solution can be synchronized, leading to autonomous oscillations in the degree of assembly which can be observed by X-ray scattering (Fig. 1), light scattering, or electron microscopy [2-5]. In addition such solutions are capable of generating spontaneous spatial patterns [6].In an earlier study we have analyzed the structure of microtubules and their cold-induced disassembly by cryo-EM [7]. One result was that disassembly takes place by loss of protofilament fragments (tubulin oligomers) which fray apart at the microtubule ends. We also looked at microtubule oscillations by time-resolved X-ray scattering and proposed a reaction scheme [4] which involves a cyclic interconversion of tubulin, microtubules, and oligomers (Fig. 2). The present study was undertaken to answer two questions: (a) What is the nature of the oscillations as seen by time-resolved cryo-EM? (b) Do microtubules disassemble by fraying protofilament fragments during oscillations at 37°C?

X-ray scattering by 1D molecular Guinier-Preston zones in ordered smectic phases

1992 ◽  
Vol 2 (6) ◽  
pp. 899-913 ◽  
Author(s):  
Patrick Davidson ◽  
Elisabeth Dubois-Violette ◽  
Anne-Marie Levelut ◽  
Brigitte Pansu
Keyword(s):  
X Ray ◽  
X Ray Scattering ◽  
Smectic Phases ◽  
Ray Scattering

An X-ray Scattering Study of Laterally Modulated Structures: Investigation of Coherence and Resolution Effects with a Grating

1996 ◽  
Vol 6 (8) ◽  
pp. 1085-1094 ◽  
Author(s):  
A. Gibaud ◽  
J. Wang ◽  
M. Tolan ◽  
G. Vignaud ◽  
S. K. Sinha
Keyword(s):  
X Ray ◽  
X Ray Scattering ◽  
Modulated Structures ◽  
Scattering Study ◽  
Ray Scattering

Pixel detectors: New detectors for X-ray scattering

2002 ◽  
Vol 12 (6) ◽  
pp. 385-390 ◽  
Author(s):  
J.-F. Bérar ◽  
L. Blanquart ◽  
N. Boudet ◽  
P. Breugnon ◽  
B. Caillot ◽  
...  
Keyword(s):  
X Ray ◽  
X Ray Scattering ◽  
Pixel Detectors ◽  
Ray Scattering
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