MERIX—Next generation medium energy resolution inelastic X-ray scattering instrument at the APS

2013 ◽  
Vol 188 ◽  
pp. 140-149 ◽  
Author(s):  
Yu.V. Shvyd’ko ◽  
J.P. Hill ◽  
C.A. Burns ◽  
D.S. Coburn ◽  
B. Brajuskovic ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Next Generation ◽  
Medium Energy ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Evaluation of 4-alkoxy-4′-nitrobiphenyl liquid crystals for use in next generation scattering LCDs

RSC Advances ◽  
2017 ◽  
Vol 7 (64) ◽  
pp. 40480-40485 ◽  
Author(s):  
Richard J. Mandle ◽  
Stephen J. Cowling ◽  
John W. Goodby
Keyword(s):  
Liquid Crystals ◽  
Electric Field ◽  
Applied Electric Field ◽  
Field Studies ◽  
Next Generation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A combination of microscopy, X-ray scattering, calorimetry and applied electric field studies demonstrates the 4-alkoxy-4′-nitrobiphenyls are potentially of use for next generation, backlight free scattering mode LCD devices.

scholarly journals X-ray Metrology for the SemiconductorIndustry Tutorial

2019 ◽  
Vol 124 ◽  
Author(s):  
Daniel F. Sunday ◽  
Wen-li Wu ◽  
Scott Barton ◽  
R. Joseph Kline
Keyword(s):  
Data Processing ◽  
Small Angle ◽  
Semiconductor Industry ◽  
Critical Dimension ◽  
Next Generation ◽  
Dimensional Metrology ◽  
X Ray ◽  
X Ray Scattering ◽  
Short Course ◽  
Ray Scattering

The semiconductor industry is in need of new, in-line dimensional metrology methods with higherspatial resolution for characterizing their next generation nanodevices. The purpose of this short course is to train the semiconductor industry on the NIST-developed critical dimension small angle X-ray scattering (CDSAXS) method. The topics will include both data processing and instrumentation. The short course will also provide an opportunity for discussion of the requirements for CDSAXS and the necessary improvements in X-ray source technology. Expected audience include semiconductor manufacturers, equipment manufacturers, and component manufacturers. The presentations were made at “X-ray Metrology for the Semiconductor Industry” short course at the National Institute of Standards and Technology on Aug. 25, 2016.

Inelastic x-ray scattering at modest energy resolution

1997 ◽  
Author(s):  
K. D. Finkelstein ◽  
J. Z. Tischler ◽  
B. C. Larson
Keyword(s):  
Energy Resolution ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Collimating Montel mirror as part of a multi-crystal analyzer system for resonant inelastic X-ray scattering

2016 ◽  
Vol 23 (4) ◽  
pp. 880-886 ◽  
Author(s):  
Jungho Kim ◽  
Xianbo Shi ◽  
Diego Casa ◽  
Jun Qian ◽  
XianRong Huang ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Incident Beam ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Angular Acceptance ◽  
Crystal Analyzer ◽  
Present Design ◽  
Photon Source ◽  
Ray Scattering

Advances in resonant inelastic X-ray scattering (RIXS) have come in lockstep with improvements in energy resolution. Currently, the best energy resolution at the IrL3-edge stands at ∼25 meV, which is achieved using a diced Si(844) spherical crystal analyzer. However, spherical analyzers are limited by their intrinsic reflection width. A novel analyzer system using multiple flat crystals provides a promising way to overcome this limitation. For the present design, an energy resolution at or below 10 meV was selected. Recognizing that the angular acceptance of flat crystals is severely limited, a collimating element is essential to achieve the necessary solid-angle acceptance. For this purpose, a laterally graded, parabolic, multilayer Montel mirror was designed for use at the IrL3-absorption edge. It provides an acceptance larger than 10 mrad, collimating the reflected X-ray beam to smaller than 100 µrad, in both vertical and horizontal directions. The performance of this mirror was studied at beamline 27-ID at the Advanced Photon Source. X-rays from a diamond (111) monochromator illuminated a scattering source of diameter 5 µm, generating an incident beam on the mirror with a well determined divergence of 40 mrad. A flat Si(111) crystal after the mirror served as the divergence analyzer. From X-ray measurements, ray-tracing simulations and optical metrology results, it was established that the Montel mirror satisfied the specifications of angular acceptance and collimation quality necessary for a high-resolution RIXS multi-crystal analyzer system.

Energy recovery LINAC: A next generation source for inelastic X-ray scattering

2005 ◽  
Vol 66 (12) ◽  
pp. 2310-2312 ◽  
Author(s):  
K.D. Finkelstein ◽  
I.V. Bazarov ◽  
M. Liepe ◽  
Q. Shen ◽  
D. Bilderback ◽  
...  
Keyword(s):  
Energy Recovery ◽  
Next Generation ◽  
X Ray ◽  
X Ray Scattering ◽  
Energy Recovery Linac ◽  
Ray Scattering

scholarly journals High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering

2018 ◽  
Vol 25 (2) ◽  
pp. 373-377 ◽  
Author(s):  
Ayman H. Said ◽  
Thomas Gog ◽  
Michael Wieczorek ◽  
XianRong Huang ◽  
Diego Casa ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Absorption Edge ◽  
High Energy ◽  
Fabrication Process ◽  
High Energy Resolution ◽  
Magnetic Excitations ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the IrL3absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr3Ir2O7sample is shown.

scholarly journals Resonant inelastic X-ray scattering using a miniature dispersive Rowland refocusing spectrometer

2020 ◽  
Vol 27 (2) ◽  
pp. 446-454
Author(s):  
Alexander S. Ditter ◽  
William M. Holden ◽  
Samantha K. Cary ◽  
Veronika Mocko ◽  
Matthew J. Latimer ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Emission Spectroscopy ◽  
Spot Size ◽  
High Energy ◽  
Extensive Study ◽  
High Energy Resolution ◽  
X Ray ◽  
X Ray Scattering ◽  
Scientific Mission ◽  
Ray Scattering

X-ray absorption spectroscopy (XAS) beamlines worldwide are steadily increasing their emphasis on full photon-in/photon-out spectroscopies, such as resonant inelastic X-ray scattering (RIXS), resonant X-ray emission spectroscopy (RXES) and high energy resolution fluorescence detection XAS (HERFD-XAS). In such cases, each beamline must match the choice of emission spectrometer to the scientific mission of its users. Previous work has recently reported a miniature tender X-ray spectrometer using a dispersive Rowland refocusing (DRR) geometry that functions with high energy resolution even with a large X-ray spot size on the sample [Holden et al. (2017). Rev. Sci. Instrum. 88, 073904]. This instrument has been used in the laboratory in multiple studies of non-resonant X-ray emission spectroscopy using a conventional X-ray tube, though only for preliminary measurements at a low-intensity microfocus synchrotron beamline. This paper reports an extensive study of the performance of a miniature DRR spectrometer at an unfocused wiggler beamline, where the incident monochromatic flux allows for resonant studies which are impossible in the laboratory. The results support the broader use of the present design and also suggest that the DRR method with an unfocused beam could have important applications for materials with low radiation damage thresholds and that would not survive analysis on focused beamlines.

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