scholarly journals Cartilage and bone markers and inflammatory cytokines are increased in synovial fluid in the acute phase of knee injury (hemarthrosis) – a cross-sectional analysis

2012 ◽  
Vol 20 (11) ◽  
pp. 1302-1308 ◽  
Author(s):  
P. Swärd ◽  
R. Frobell ◽  
M. Englund ◽  
H. Roos ◽  
A. Struglics
Keyword(s):  
Synovial Fluid ◽  
Inflammatory Cytokines ◽  
Acute Phase ◽  
Knee Injury ◽  
Bone Markers ◽  
Cross Sectional ◽  
Cross Sectional Analysis ◽  
Sectional Analysis

Evaluation of the prevalence and nutritional and social determinants of overweight in a population of schoolchildren: a cross-sectional analysis of 5,037 children

2012 ◽  
Vol 58 (4) ◽  
pp. 472-476 ◽  
Author(s):  
Caroline Filla Rosaneli ◽  
Flavia Auler ◽  
Carla Barreto Manfrinato ◽  
Claudine Filla Rosaneli ◽  
Caroline Sganzerla ◽  
...  
Keyword(s):  
Social Determinants ◽  
Cross Sectional ◽  
Cross Sectional Analysis ◽  
Sectional Analysis

Quantitative Clinical Characteristics of 53 Patients with MPS VII: A Cross-Sectional Analysis

2017 ◽  
Vol 48 (S 01) ◽  
pp. S1-S45
Author(s):  
M. Zielonka ◽  
S. Garbade ◽  
S. Kölker ◽  
G. Hoffmann ◽  
M. Ries
Keyword(s):  
Clinical Characteristics ◽  
Cross Sectional ◽  
Cross Sectional Analysis ◽  
Mps Vii ◽  
Sectional Analysis

Fracture prevalence in children 0-19 years-old in Mexico: A 10-year cross-sectional analysis

2019 ◽  
Author(s):  
Patricia Clark ◽  
Annarella Barbato ◽  
Miguel Angel Guagnelli ◽  
Jose Alberto Rascon ◽  
Edgar Denova ◽  
...  
Keyword(s):  
Cross Sectional ◽  
Cross Sectional Analysis ◽  
Fracture Prevalence ◽  
Sectional Analysis

2174-PUB: Profiling of Young Diabetes in India: A Cross-Sectional Analysis Report

Diabetes ◽  
2020 ◽  
Vol 69 (Supplement 1) ◽  
pp. 2174-PUB
Author(s):  
NARAYANAN NK ◽  
CS DWARAKANATH ◽  
VENKATARAMAN S ◽  
MANIKANDAN RM ◽  
NARENDRA BS ◽  
...  
Keyword(s):  
Cross Sectional ◽  
Cross Sectional Analysis ◽  
Sectional Analysis

Quantitative Electrical Analysis of FIB Prepared Vias on BiCMOS and CMOS090 Designs

2006 ◽  
Author(s):  
B. Domengès ◽  
P. Poirier
Keyword(s):  
Ion Beam ◽  
Beam Current ◽  
Kelvin Probe ◽  
Metal Line ◽  
Cross Sectional ◽  
Probe Technique ◽  
Cross Sectional Analysis ◽  
Controlling Parameter ◽  
Electrical Analysis ◽  
Sectional Analysis

Abstract In this study, the resistance of FIB prepared vias was characterized by the Kelvin probe technique and their physical characteristics studied using cross-sectional analysis. Two domains of resistivity were isolated in relation to the ion beam current used for the deposition of the via metal (Pt). Also submicrometer vias were investigated on 4.2 µm deep metal lines of a BiCMOS aluminum based design and a CMOS 090 copper based one. It is shown that the controlling parameter is the shape and volume of the contact, and that the contact formation is favored by the amount of over-mill of the via into the metal line it will contact.

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