scholarly journals Micro-mechanical and fracture characteristics of Cu 6 Sn 5 and Cu 3 Sn intermetallic compounds under micro-cantilever bending

2016 ◽  
Vol 76 ◽  
pp. 10-17 ◽  
Author(s):  
Li Liu ◽  
Zhiwen Chen ◽  
Changqing Liu ◽  
Yiping Wu ◽  
Bing An
2022 ◽  
pp. 110398
Author(s):  
Jae-Hoon Choi ◽  
Hojang Kim ◽  
Ji-Young Kim ◽  
Kwang-Hyeok Lim ◽  
Byung-Chai Lee ◽  
...  

2020 ◽  
Vol 794 ◽  
pp. 139967 ◽  
Author(s):  
Tarlan Hajilou ◽  
Iman Taji ◽  
Frederic Christien ◽  
Shuang He ◽  
Daniel Scheiber ◽  
...  

Author(s):  
Yun Deng ◽  
Tarlan Hajilou ◽  
Afrooz Barnoush

To evaluate the hydrogen (H)-induced embrittlement in iron aluminium intermetallics, especially the one with stoichiometric composition of 50 at.% Al, a novel in situ micro-cantilever bending test was applied within an environmental scanning electron microscope (ESEM), which provides both a full process monitoring and a clean, in situ H-charging condition. Two sets of cantilevers were analysed in this work: one set of un-notched cantilevers, and the other set with focused ion beam-milled notch laying on two crystallographic planes: (010) and (110). The cantilevers were tested under two environmental conditions: vacuum (approximately 5 × 10 −4  Pa) and ESEM (450 Pa water vapour). Crack initiation at stress-concentrated locations and propagation to cause catastrophic failure were observed when cantilevers were tested in the presence of H; while no cracking occurred when tested in vacuum. Both the bending strength for un-notched beams and the fracture toughness for notched beams were reduced under H exposure. The hydrogen embrittlement (HE) susceptibility was found to be orientation dependent: the (010) crystallographic plane was more fragile to HE than the (110) plane. This article is part of the themed issue ‘The challenges of hydrogen and metals’.


2012 ◽  
Vol 271-272 ◽  
pp. 347-352
Author(s):  
Jian Dong ◽  
Heng Jiang ◽  
Xi Zeng

In this work, a SiON film with 25.78% nitrogen contents in film composition was deposited by RF magnetron sputtering. Micro SiON cantilevers were fabricated using MEMS sacrificial layer technology for tests. The micro-cantilever bending tests were done with the help of nanomechanical test system to characterize the Young’s modulus of the SiON. The results showed that the Young’s modulus of the SiON was 256 GPa. Because cantilevers can release the residual stress of the SiON film, the Young’s modulus we gained was more accurate than that early gained by other measuring methods.


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