Crystal and electronic structure study of AgAu and AgCu bimetallic alloy thin films by X-ray techniques

2016 ◽  
Vol 209 ◽  
pp. 53-61 ◽  
Author(s):  
O. Murat Ozkendir ◽  
E. Cengiz ◽  
E. Yalaz ◽  
Ö. Söğüt ◽  
D.H. Ayas ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
Structure Study ◽  
X Ray ◽  
Bimetallic Alloy ◽  
Crystal And Electronic Structure

Crystal and electronic structure of MCuO2±δ thin films

1991 ◽  
Vol 185-189 ◽  
pp. 2019-2020 ◽  
Author(s):  
N. Terada ◽  
G. Zouganelis ◽  
M. Jo ◽  
M. Hirabayashi ◽  
K. Kaneko ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
Crystal And Electronic Structure

A new ternary silicide GdFe1−xSi2 (x=0.32): preparation, crystal and electronic structure

2020 ◽  
Vol 75 (1-2) ◽  
pp. 217-223
Author(s):  
Volodymyr Babizhetskyy ◽  
Jürgen Köhler ◽  
Yuriy Tyvanchuk ◽  
Chong Zheng
Keyword(s):  
Electronic Structure ◽  
Tight Binding ◽  
Structure Type ◽  
X Ray Diffraction ◽  
Orthorhombic Space Group ◽  
X Ray ◽  
Arc Melting ◽  
Lmto Method ◽  
Type Orthorhombic ◽  
Crystal And Electronic Structure

AbstractThe title compound was prepared from the elements by arc-melting. The crystal structure was investigated by means of single-crystal X-ray diffraction. It crystallizes in the TbFeSi2 structure type, orthorhombic space group Cmmm, a = 4.0496(8), b = 16.416(2), c = 3.9527(6) Å, Z = 4, R1 = 0.041, wR2 = 0.11 for 207 unique reflections with Io > 2 σ(Io) and 19 refined parameters. The Fe position is not fully occupied and the refinement results in a composition GdFe0.68Si2 in agreement with a chemical analysis. The structure consists of zig-zag chains of Si(1) atoms which are terminally bound to additional Si(2) atoms. For an ordered variant GdFe0.5Si2 the Zintl concept can be applied which results in formal oxidation states Gd3+(Fe2+)0.5Si(1)1−Si(2)3−. The electronic structure of this variant GdFe0.5Si2 was analyzed using the tight-binding LMTO method and the results confirm the simple bonding picture.

Electronic structure study of liquid germanium based on x-ray-absorption near-edge structure spectroscopy

1999 ◽  
Vol 59 (3) ◽  
pp. 1571-1574 ◽  
Author(s):  
Chenxi Li ◽  
Kunquan Lu ◽  
Yuren Wang ◽  
Kozaburo Tamura ◽  
Shinya Hosokawa ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Structure Study ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption

Kristall- und elektronische Struktur von LaAlSi2 / Crystal and Electronic Structure of LaAlSi2

2001 ◽  
Vol 56 (7) ◽  
pp. 620-625 ◽  
Author(s):  
Christian Kranenberg ◽  
Dirk Johrendt ◽  
Albrecht Mewis ◽  
Winfried Kockelmann
Keyword(s):  
Crystal Structure ◽  
Electronic Structure ◽  
Neutron Diffraction ◽  
Structure Type ◽  
X Ray ◽  
Arc Melting ◽  
Band Structure Calculations ◽  
Ray Methods ◽  
Structure Calculations ◽  
Crystal And Electronic Structure

Abstract LaAlSi2 (a = 4.196(2), c = 11.437(7) Å; P3̄ml; Z = 2) was synthesized by arc-melting of preheated mixtures of the elements. The compound was investigated by means of X-ray methods and by neutron diffraction. The crystal structure can be described as a stacking variant of two different segments. The first one corresponds to the CaAl2Si2 structure type (LaAl2Si2), the second one with the A1B2 structure type (LaSi2). The segments are stacked along [001]. The electronic structure of the compound is discussed on the basis of LMTO band structure calculations.

scholarly journals Crystal and electronic structure study of the Li2Mn1-xNdxO3 battery cathode

2019 ◽  
Vol 29 (2) ◽  
pp. 119-123 ◽  
Author(s):  
Gültekin Çelik ◽  
Sevda Aktaş ◽  
Şule Ateş ◽  
O. Murat Özkendir ◽  
Wantana Klysubun
Keyword(s):  
Electronic Structure ◽  
Structure Study ◽  
Crystal And Electronic Structure

Local structure study of (In0.95−xFexCu0.05)2O3 thin films using x-ray absorption spectroscopy

2015 ◽  
Vol 33 (4) ◽  
pp. 041513
Author(s):  
Yuan Ren ◽  
Yaya Xing ◽  
Guanxiong Ma ◽  
Xingliang Zhao ◽  
Shiqi Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Local Structure ◽  
Structure Study ◽  
X Ray ◽  
X Ray Absorption

Near edge X-ray absorption fine structure study of Zn[sub 0.8]Mg[sub 0.2]O thin films

2013 ◽  
Author(s):  
Ankush Vij ◽  
Amanpal Singh ◽  
Ravi Kumar ◽  
Sanjeev Gautam ◽  
Dinesh Kumar ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Structure Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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